Inventor · disambiguated record
Chang-Hyun Cho
Also filed as: CHO CHANG · CHO CHANG-HYUN
61 granted patents·11 pending applications·729 citations·filing 1996–2024
99Inventor score
Top patents by PatentIndex Score
72 records- 0193US10804277B2Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 13, 2020·6 cites·20 claims
- 0292US10050041B1Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Aug 14, 2018·6 cites·10 claims
- 0392US9177891B2Semiconductor device including contact padsSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Nov 3, 2015·12 cites·14 claims
- 0491US6335233B1Method for fabricating MOS transistorSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 1, 2002·130 cites·10 claims
- 0590US10204910B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 12, 2019·7 cites·28 claims
- 0688US7329918B2Semiconductor memory device including storage nodes and resistors and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 12, 2008·15 cites·8 claims
- 0785US2025040127A1Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0884US9985034B2Method of manufacturing a semiconductor deviceYOON CHAN SIC·Filed 2015·Granted May 29, 2018·5 cites·20 claims
- 0981US9899487B2Semiconductor devices and methods of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 20, 2018·4 cites·16 claims
- 1081US8656800B2Harmonic drive using profile shifted gearCHO CHANG-HYUN·Filed 2008·Granted Feb 25, 2014·11 cites·15 claims
- 1180US7388243B2Self-Aligned buried contact pairSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 17, 2008·8 cites·15 claims
- 1280US6465310B2Methods of forming self-aligned contact pads on electrically conductive linesSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Oct 15, 2002·20 cites·10 claims
- 1380US6204161B1Self aligned contact pad in a semiconductor device and method for forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Mar 20, 2001·58 cites·19 claims
- 1479US12144167B2Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Nov 12, 2024·0 cites·20 claims
- 1579US9349724B2Semiconductor device having capacitorsSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted May 24, 2016·6 cites·19 claims
- 1678US7670910B2Method of forming self-aligned inner gate recess channel transistorSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Mar 2, 2010·7 cites·38 claims
- 1778US6562697B1Methods of implanting ions into different active areas to provide active areas having increased ion concentrations adjacent to isolation structuresSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted May 13, 2003·22 cites·18 claims
- 1877US7138675B2Semiconductor devices having storage nodesSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 21, 2006·7 cites·12 claims
- 1977US7056786B2Self-aligned buried contact pair and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 6, 2006·20 cites·35 claims
- 2077US5946246ASemiconductor memory device with built-in self test circuitSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Aug 31, 1999·42 cites·20 claims
- 2176US8378698B2Integrated circuit testing apparatus and methodSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Feb 19, 2013·3 cites·20 claims
- 2276US6902998B2Methods of manufacturing semiconductor devices having storage nodesSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 7, 2005·21 cites·27 claims
- 2375US6177320B1Method for forming a self aligned contact in a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 23, 2001·50 cites·30 claims
- 2474US7154144B2Self-aligned inner gate recess channel transistor and method of forming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Dec 26, 2006·19 cites·14 claims
- 2574US5844914ATest circuit and method for refresh and descrambling in an integrated memory circuitSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Dec 1, 1998·42 cites·8 claims
- 2673US10811118B2Test interface boards, test systems, and methods of operating test interface boardsSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Oct 20, 2020·1 cites·20 claims
- 2773US7476585B2Semiconductor device including storage node and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jan 13, 2009·3 cites·15 claims
- 2872US11462547B2Semiconductor device and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Oct 4, 2022·0 cites·20 claims
- 2969US8434384B2Weight compensation mechanism and method using bevel gear and robot arm using the sameKANG SUNG CHUL·Filed 2010·Granted May 7, 2013·6 cites·8 claims
- 3066US6890841B2Methods of forming integrated circuit memory devices that include a plurality of landing pad holes that are arranged in a staggered pattern and integrated circuit memory devices formed therebySAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted May 10, 2005·14 cites·24 claims
- 3166US6355547B1Method of forming a self-aligned contact pad for a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Mar 12, 2002·13 cites·19 claims
- 3265US8765572B2Method of fabricating semiconductor deviceCHOI YONG-LACK·Filed 2011·Granted Jul 1, 2014·3 cites·19 claims
- 3365US8525538B2Apparatus and method for testing a semiconductor deviceKIM YANGGI·Filed 2010·Granted Sep 3, 2013·5 cites·20 claims
- 3464US10832983B2Semiconductor device having a trench type device isolation film and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Nov 10, 2020·1 cites·16 claims
- 3564US2024246225A1Robot for assisting limbsUNIV CHOSUN IACF·Filed 2024·Application pending·0 cites
- 3663US7180118B2Semiconductor device including storage node and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Feb 20, 2007·7 cites·16 claims
- 3761US6337282B2Method for forming a dielectric layerSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 8, 2002·27 cites·7 claims
- 3860US6242332B1Method for forming self-aligned contactSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jun 5, 2001·26 cites·14 claims
- 3959US6136657AMethod for fabricating a semiconductor device having different gate oxide layersSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Oct 24, 2000·18 cites·11 claims
- 4058US8493087B2Probe card, and apparatus and method for testing semiconductor device using the probe cardCHO CHANG-HYUN·Filed 2009·Granted Jul 23, 2013·3 cites·20 claims
- 4158US7074667B2Semiconductor memory device including storage nodes and resistors and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 11, 2006·7 cites·16 claims
- 4257US6268252B1Method of forming self-aligned contact pads on electrically conductive linesSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jul 31, 2001·18 cites·8 claims
- 4354US8794099B2Weight compensation mechanism and robot arm using the sameKANG SUNG CHUL·Filed 2011·Granted Aug 5, 2014·1 cites·13 claims
- 4452US7236850B2Working robot, actuator and control method thereofKOREA INST SCI & TECH·Filed 2002·Granted Jun 26, 2007·9 cites·20 claims
- 4552US6768148B1Devices with active areas having increased ion concentrations adjacent to isolation structuresSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jul 27, 2004·4 cites·11 claims
- 4651US9536868B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jan 3, 2017·0 cites·20 claims
- 4749US11268215B2Method of producing carbon fiberHPK INC·Filed 2020·Granted Mar 8, 2022·0 cites·16 claims
- 4848US6337275B1Method for forming a self aligned contact in a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 8, 2002·14 cites·8 claims
- 4947US11367865B2Method of manufacturing composite anode material and composite anode material for lithium secondary batteryHPK INC·Filed 2019·Granted Jun 21, 2022·0 cites·7 claims
- 5047US7279741B2Semiconductor device with increased effective channel length and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Oct 9, 2007·1 cites·21 claims
Showing the top 50 of 72 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →