Inventor · disambiguated record
Choongyeun Cho
Also filed as: CHO CHOONGYEUN
16 granted patents·4 pending applications·70 citations·filing 2006–2013
91Inventor score
Top patents by PatentIndex Score
20 records- 0190US7939910B2Structure for symmetrical capacitorIBM·Filed 2010·Granted May 10, 2011·11 cites·10 claims
- 0287US7821110B2Circuit structures and methods with BEOL layer(s) configured to block electromagnetic interferenceIBM·Filed 2007·Granted Oct 26, 2010·17 cites·12 claims
- 0381US7904494B2Random number generator with random samplingIBM·Filed 2006·Granted Mar 8, 2011·11 cites·20 claims
- 0481US7838384B2Structure for symmetrical capacitorIBM·Filed 2008·Granted Nov 23, 2010·8 cites·8 claims
- 0574US8792080B2Method and system to predict lithography focus error using simulated or measured topographySAPP BRIAN CHRISTOPHER·Filed 2011·Granted Jul 29, 2014·2 cites·11 claims
- 0673US7504705B2Striped on-chip inductorIBM·Filed 2006·Granted Mar 17, 2009·4 cites·6 claims
- 0769US8138563B2Circuit structures and methods with BEOL layers configured to block electromagnetic edge interferenceCHO CHOONGYEUN·Filed 2008·Granted Mar 20, 2012·4 cites·20 claims
- 0865US8227891B2Striped on-chip inductorCHO CHOONGYEUN·Filed 2009·Granted Jul 24, 2012·2 cites·29 claims
- 0965US7791403B2Transitioning digital integrated circuit from standby mode to active mode via backgate charge transferIBM·Filed 2008·Granted Sep 7, 2010·3 cites·15 claims
- 1061US8273648B2Circuit structures and methods with BEOL layers configured to block electromagnetic edge interferenceCHO CHOONGYEUN·Filed 2012·Granted Sep 25, 2012·1 cites·10 claims
- 1161US7804329B2Internal charge transfer for circuitsIBM·Filed 2008·Granted Sep 28, 2010·4 cites·20 claims
- 1260US2014071416A1Method and system to predict lithography focus error using simulated or measured topographyIBM·Filed 2013·Application pending·0 cites
- 1360US2014075399A1Method and system to predict lithography focus error using simulated or measured topographyIBM·Filed 2013·Application pending·0 cites
- 1460US2014075396A1Method and system to predict lithography focus error using simulated or measured topographyIBM·Filed 2013·Application pending·0 cites
- 1557US8148953B2Apparatus and method for recycling and reusing charge in an electronic circuitCHO CHOONGYEUN·Filed 2007·Granted Apr 3, 2012·3 cites·24 claims
- 1652US8937355B2Striped on-chip inductorCHO CHOONGYEUN·Filed 2012·Granted Jan 20, 2015·0 cites·7 claims
- 1748US2007267733A1Symmetrical MIMCAP capacitor designIBM·Filed 2006·Application pending·0 cites
- 1847US8723646B2Acoustic wave and radio frequency identification device and methodCHO CHOONGYEUN·Filed 2008·Granted May 13, 2014·0 cites·21 claims
- 1944US7902880B2Transitioning digital integrated circuit from standby mode to active mode via backgate charge transferIBM·Filed 2010·Granted Mar 8, 2011·0 cites·8 claims
- 2043US9013310B2Circuit structure and method of fabrication for facilitating radio frequency identification (RFID)CHO CHOONGYEUN·Filed 2008·Granted Apr 21, 2015·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →