Inventor · disambiguated record
Chung-Pin Chou
Also filed as: CHOU CHUNG-PIN
15 granted patents·5 pending applications·20 citations·filing 2019–2024
89Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD20
Top patents by PatentIndex Score
20 records- 0195US11764094B2Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 19, 2023·2 cites·20 claims
- 0293US11816411B2Method and system for semiconductor wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Nov 14, 2023·5 cites·20 claims
- 0390US12038389B2Wafer inspection apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 16, 2024·1 cites·20 claims
- 0489US11300525B2Wafer inspection apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 12, 2022·2 cites·20 claims
- 0589US10825650B2Machine learning on wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Nov 3, 2020·6 cites·20 claims
- 0688US12119273B2System and method for high speed inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 15, 2024·1 cites·20 claims
- 0783US11749571B2System and method for high speed inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 5, 2023·1 cites·20 claims
- 0881US12087611B2Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 10, 2024·0 cites·20 claims
- 0978US2024379401A1Semiconductor processing tool and methods of operationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1077US2024319109A1Wafer inspection apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1176US11935722B2Machine learning on wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Mar 19, 2024·0 cites·20 claims
- 1275US12190036B2Method and system for semiconductor wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jan 7, 2025·0 cites·20 claims
- 1374US2024379463A1Systems for inspection of semiconductor substratesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1472US10871454B2Inspection method and apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 22, 2020·1 cites·20 claims
- 1572US2024387212A1Apparatus and methods for determining fluid dynamics of liquid film on wafer surfaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1670US11424101B2Machine learning on wafer defect reviewTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Aug 23, 2022·0 cites·20 claims
- 1769US11017522B2Inspection and cleaning system and method for the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 25, 2021·1 cites·20 claims
- 1867US2023384211A1In-situ apparatus for detecting abnormality in process tubeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1961US12326397B2In-situ apparatus for detecting abnormality in process tubeTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 10, 2025·0 cites·20 claims
- 2061US12272576B2Apparatus and methods for determining fluid dynamics of liquid film on wafer surfaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 8, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →