Inventor · disambiguated record

Chung-Sam Chun

Also filed as: CHUN CHUNG-SAM

1 granted patent·67 citations·filing 2000–2000

51Inventor score

Technology areasG01N

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0190US6440760B1Method of measuring etched state of semiconductor wafer using optical impedence measurementSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 27, 2002·67 cites·67 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →