Inventor · disambiguated record

Champ Gohil

Also filed as: GOHIL CHAMP

1 granted patent·0 citations·filing 2014–2014

1Inventor score

Technology areasG06T

Files withCarl Zeiss Microscopy Ltd1

Top patents by PatentIndex Score

1 record

0126US10955368B2Method and data analysis system for semi-automated particle analysis using a charged particle beamCarl Zeiss Microscopy Ltd·Filed 2014·Granted Mar 23, 2021·0 cites·9 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →