Inventor · disambiguated record
Christopher Gould
Also filed as: GOULD CHRISTOPHER · GOULD CHRISTOPHER J
2 granted patents·130 citations·filing 1998–2000
67Inventor score
Top patents by PatentIndex Score
2 records- 0188US6150231AOverlay measurement technique using moire patternsSIEMENS AG·Filed 1998·Granted Nov 21, 2000·114 cites·5 claims
- 0276US6727989B1Enhanced overlay measurement marks for overlay alignment and exposure tool condition controlINFINEON TECHNOLOGIES AG·Filed 2000·Granted Apr 27, 2004·16 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →