Inventor · disambiguated record
Christopher Richard Hamner
Also filed as: HAMNER CHRISTOPHER · HAMNER CHRISTOPHER RICHARD
12 granted patents·1 pending application·41 citations·filing 2019–2023
86Inventor score
Top patents by PatentIndex Score
13 records- 0195US11644298B2Inductive position detection configuration for indicating a measurement device stylus positionMITUTOYO CORP·Filed 2020·Granted May 9, 2023·8 cites·20 claims
- 0295US11644299B2Inductive position sensor signal gain control for coordinate measuring machine probeMITUTOYO CORP·Filed 2020·Granted May 9, 2023·5 cites·23 claims
- 0395US11543899B2Inductive position detection configuration for indicating a measurement device stylus position and including coil misalignment compensationMITUTOYO CORP·Filed 2020·Granted Jan 3, 2023·9 cites·20 claims
- 0495US10914570B2Inductive position detection configuration for indicating a measurement device stylus positionMITUTOYO CORP·Filed 2019·Granted Feb 9, 2021·15 cites·25 claims
- 0591US12174013B2Measuring probe with sensing coils and temperature compensationMITUTOYO CORP·Filed 2022·Granted Dec 24, 2024·2 cites·21 claims
- 0689US11740064B2Inductive position detection configuration for indicating a measurement device stylus positionMITUTOYO CORP·Filed 2021·Granted Aug 29, 2023·2 cites·22 claims
- 0767US12011785B2Laser-processing apparatus, methods of operating the same, and methods of processing workpieces using the sameELECTRO SCIENT IND INC·Filed 2019·Granted Jun 18, 2024·0 cites·12 claims
- 0865US12352704B2Metrology system for measuring edge of circular workpieceMITUTOYO CORP·Filed 2022·Granted Jul 8, 2025·0 cites·20 claims
- 0957US12320635B2Measuring probe with field generating coil configuration and temperature compensationMITUTOYO CORP·Filed 2022·Granted Jun 3, 2025·0 cites·20 claims
- 1053US12204226B2Metrology system configured to illuminate and measure apertures of workpiecesMITUTOYO CORP·Filed 2023·Granted Jan 21, 2025·0 cites·20 claims
- 1150US11713956B2Shielding for sensor configuration and alignment of coordinate measuring machine probeMITUTOYO CORP·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 1249US11733021B2Modular configuration for coordinate measuring machine probeMITUTOYO CORP·Filed 2021·Granted Aug 22, 2023·0 cites·20 claims
- 1344US2023421909A1Lighting configuration for metrology system with images acquired at different focus positionsMITUTOYO CORP·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →