Inventor · disambiguated record
Chunying Han
Also filed as: HAN CHUNYING
1 granted patent·1 pending application·0 citations·filing 2021–2021
8Inventor score
Technology areasH10W
Top patents by PatentIndex Score
2 records- 0144US11934109B2Overlay alignment mark and method for measuring overlay errorZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2021·Granted Mar 19, 2024·0 cites·13 claims
- 0238US2021382401A1Overlay alignment mark, method for measuring overlay error, and method for overlay alignmentZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →