Inventor · disambiguated record
Changguang He
Also filed as: HE CHANGGUANG
3 granted patents·8 citations·filing 2005–2022
60Inventor score
Technology areasG01N
Top patents by PatentIndex Score
3 records- 0183US12099025B2Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detectionTHE 59TH INST OF CHINA ORDNANCE INDUSTRY·Filed 2022·Granted Sep 24, 2024·2 cites·10 claims
- 0274US11846595B2Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpieceTHE 59TH INST OF CHINA ORDNANCE INDUSTRY·Filed 2019·Granted Dec 19, 2023·2 cites·18 claims
- 0362US7583788B2Measuring device for the shortwavelength x ray diffraction and a method thereofSOUTH WEST TECHNOLOGY & ENGINE·Filed 2005·Granted Sep 1, 2009·4 cites·44 claims
Join the waitlist — get patent alerts
Get an alert when Changguang He files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →