Inventor · disambiguated record
Charles J. Hendricks
Also filed as: HENDRICKS CHARLES · HENDRICKS CHARLES J · HENDRICKS CHARLES JOSEPH
12 granted patents·1 pending application·677 citations·filing 1980–2005
91Inventor score
Files withIBM13
Top patents by PatentIndex Score
13 records- 0196US4600464APlasma etching reactor with reduced plasma potentialIBM·Filed 1985·Granted Jul 15, 1986·121 cites·11 claims
- 0296US4534816ASingle wafer plasma etch reactorIBM·Filed 1984·Granted Aug 13, 1985·458 cites·14 claims
- 0385US4340461AModified RIE chamber for uniform silicon etchingIBM·Filed 1980·Granted Jul 20, 1982·30 cites·9 claims
- 0462US7294909B2Electronic package repair processIBM·Filed 2005·Granted Nov 13, 2007·2 cites·14 claims
- 0551US6235544B1Seed metal delete process for thin film repair solutions using direct UV laserIBM·Filed 1999·Granted May 22, 2001·19 cites·9 claims
- 0650US6281692B1Interposer for maintaining temporary contact between a substrate and a test bedIBM·Filed 1998·Granted Aug 28, 2001·15 cites·10 claims
- 0749US5904868AMounting and/or removing of components using optical fiber toolsIBM·Filed 1997·Granted May 18, 1999·13 cites·60 claims
- 0845US6054863ASystem for testing circuit board integrityIBM·Filed 1996·Granted Apr 25, 2000·15 cites·14 claims
- 0944US6916670B2Electronic package repair processIBM·Filed 2003·Granted Jul 12, 2005·1 cites·25 claims
- 1040US6753688B2Interconnect package cluster probe short removal apparatus and methodIBM·Filed 2001·Granted Jun 22, 2004·3 cites·21 claims
- 1135US2002179320A1Flexible conductive sheetIBM·Filed 2001·Application pending·0 cites
- 1233US7808257B2Ionization test for electrical verificationIBM·Filed 2003·Granted Oct 5, 2010·0 cites·63 claims
- 1331US6984997B2Method and system for testing multi-chip integrated circuit modulesIBM·Filed 2003·Granted Jan 10, 2006·0 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →