Inventor · disambiguated record
Christian Holzner
Also filed as: HOLZNER CHRISTIAN
4 granted patents·1 pending application·23 citations·filing 2013–2019
73Inventor score
Files withCARL ZEISS X RAY MICROSCOPY INC3UNIV DANMARKS TEKNISKE1ZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH1
Top patents by PatentIndex Score
5 records- 0189US9383324B2Laboratory X-ray micro-tomography system with crystallographic grain orientation mapping capabilitiesCARL ZEISS X RAY MICROSCOPY INC·Filed 2015·Granted Jul 5, 2016·5 cites·24 claims
- 0286US9222900B2X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatusUNIV DANMARKS TEKNISKE·Filed 2013·Granted Dec 29, 2015·10 cites·28 claims
- 0386US9110004B2Laboratory x-ray micro-tomography system with crystallographic grain orientation mapping capabilitiesCARL ZEISS X RAY MICROSCOPY INC·Filed 2013·Granted Aug 18, 2015·7 cites·31 claims
- 0460US11633918B2Method and device for additive manufacturing utilizing simulation test results of a workpieceZEISS CARL INDUSTRIELLE MESSTECHNIK GMBH·Filed 2019·Granted Apr 25, 2023·1 cites·14 claims
- 0546US2015055745A1Phase Contrast Imaging Using Patterned Illumination/Detector and Phase MaskCARL ZEISS X RAY MICROSCOPY INC·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →