Inventor · disambiguated record
Chung-Lun Hsu
Also filed as: HSU CHUNG-LUN · HSU CHUNG-LUN E · HSU CHUNG-LUN EDWIN
7 granted patents·4 pending applications·6 citations·filing 2013–2024
73Inventor score
Top patents by PatentIndex Score
11 records- 0190US11657742B1Circuitry for screening defective portion of display chipAPPLE INC·Filed 2021·Granted May 23, 2023·2 cites·20 claims
- 0289US11783739B2On-chip testing architecture for display systemAPPLE INC·Filed 2021·Granted Oct 10, 2023·2 cites·18 claims
- 0375US2025137036A1Electrochemical biosensor array devices, systems, and methods for point-of-care detectionUNIV CALIFORNIA·Filed 2024·Application pending·0 cites
- 0470US11320468B2Wide dynamic range current measurement front-endUNIV CALIFORNIA·Filed 2018·Granted May 3, 2022·2 cites·28 claims
- 0559US2024402237A1Electrical Testing for Panel Characterization and Defect ScreeningAPPLE INC·Filed 2024·Application pending·0 cites
- 0658US12157914B2Electrochemical biosensor array devices, systems, and methods for point-of-care detectionUNIV CALIFORNIA·Filed 2019·Granted Dec 3, 2024·0 cites·24 claims
- 0757US12027117B2Pixel screening and repairAPPLE INC·Filed 2021·Granted Jul 2, 2024·0 cites·20 claims
- 0842US2014304675A1Electronic element design system and methodHON HAI PREC IND CO LTD·Filed 2014·Application pending·0 cites
- 0942US2014304676A1Electronic element design system and methodHON HAI PREC IND CO LTD·Filed 2014·Application pending·0 cites
- 1041US9218260B2Host device and method for testing booting of serversHON HAI PREC IND CO LTD·Filed 2013·Granted Dec 22, 2015·0 cites·15 claims
- 1141US9195556B2Host device and method for testing booting of serversHON HAI PREC IND CO LTD·Filed 2013·Granted Nov 24, 2015·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →