Inventor · disambiguated record
Chengshih Huang
Also filed as: HUANG CHENGSHIH
1 granted patent·1 pending application·0 citations·filing 2013–2018
2Inventor score
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2 records- 0136US10605596B2Method and apparatus for measuring a size of a crystal grain, and method for fabricating a poly-silicon thin filmBOE TECHNOLOGY GROUP CO LTD·Filed 2018·Granted Mar 31, 2020·0 cites·11 claims
- 0221US2015016482A1Quality detection device for laser source and the quality detection method thereofEVERDISPLAY OPTRONICS SHANGHAI LTD·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →