Inventor · disambiguated record
Chun-Shun Huang
Also filed as: HUANG CHUN-SHUN
9 granted patents·2 pending applications·3 citations·filing 2018–2025
76Inventor score
Files withNANYA TECHNOLOGY CORP11
Top patents by PatentIndex Score
11 records- 0193US11646353B1Semiconductor device structureNANYA TECHNOLOGY CORP·Filed 2021·Granted May 9, 2023·3 cites·17 claims
- 0273US2025300025A1Semiconductor structure for detecting vertical electrical leakageNANYA TECHNOLOGY CORP·Filed 2025·Application pending·0 cites
- 0364US11569369B2Method for manufacturing a semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2021·Granted Jan 31, 2023·0 cites·8 claims
- 0463US11024553B2Semiconductor structure and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2020·Granted Jun 1, 2021·0 cites·7 claims
- 0563US2024006252A1Semiconductor structure for detecting vertical electrical leakageNANYA TECHNOLOGY CORP·Filed 2022·Application pending·0 cites
- 0657US11521901B2Method for preparing semiconductor deviceNANYA TECHNOLOGY CORP·Filed 2021·Granted Dec 6, 2022·0 cites·4 claims
- 0756US10985077B2Semiconductor device and method for preparing the sameNANYA TECHNOLOGY CORP·Filed 2019·Granted Apr 20, 2021·0 cites·5 claims
- 0856US10825744B2Semiconductor structure and manufacturing method thereofNANYA TECHNOLOGY CORP·Filed 2018·Granted Nov 3, 2020·0 cites·8 claims
- 0955US12283530B2Method for manufacturing a semiconductor structure for detecting vertical electrical leakageNANYA TECHNOLOGY CORP·Filed 2022·Granted Apr 22, 2025·0 cites·7 claims
- 1055US11094795B2Semiconductor device and method for manufacturing the sameNANYA TECHNOLOGY CORP·Filed 2019·Granted Aug 17, 2021·0 cites·10 claims
- 1151US12250833B2Method for manufacturing semiconductor device structureNANYA TECHNOLOGY CORP·Filed 2021·Granted Mar 11, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →