Inventor · disambiguated record
Chan Sun Hyun
Also filed as: HYUN CHAN SUN
19 granted patents·4 pending applications·57 citations·filing 2006–2018
91Inventor score
Top patents by PatentIndex Score
23 records- 0194US9373540B2Semiconductor device and method of fabricating the sameSK HYNIX INC·Filed 2014·Granted Jun 21, 2016·23 cites·20 claims
- 0289US9911751B2Manufacturing method for semiconductor device having hole penetrating stack structureSK HYNIX INC·Filed 2016·Granted Mar 6, 2018·6 cites·12 claims
- 0386US9224751B2Three-dimensional (3D) semiconductor deviceSK HYNIX INC·Filed 2014·Granted Dec 29, 2015·7 cites·12 claims
- 0484US7972967B1Method of forming patterns of a semiconductor device including forming spacers on sidewalls of auxiliary patterns and removing exposed auxiliary patternsHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Jul 5, 2011·7 cites·21 claims
- 0575US7576011B2Method of forming contact plug in semiconductorHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Aug 18, 2009·7 cites·15 claims
- 0667US9589980B2Semiconductor device and method of manufacturing the sameSK HYNIX INC·Filed 2014·Granted Mar 7, 2017·2 cites·9 claims
- 0764US9368511B2Three-dimensional (3D) semiconductor deviceSK HYNIX INC·Filed 2015·Granted Jun 14, 2016·1 cites·9 claims
- 0861US7696087B2Method of forming a dual damascene pattern of a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Apr 13, 2010·2 cites·20 claims
- 0958US8048739B2Method of manufacturing flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 1, 2011·1 cites·16 claims
- 1057US7335558B2Method of manufacturing NAND flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Feb 26, 2008·1 cites·6 claims
- 1154US10141332B2Manufacturing method for semiconductor device having hole penetrating stack structureSK HYNIX INC·Filed 2018·Granted Nov 27, 2018·0 cites·8 claims
- 1251US9754962B2Three-dimensional (3D) semiconductor deviceSK HYNIX INC·Filed 2016·Granted Sep 5, 2017·0 cites·11 claims
- 1350US9484247B2Semiconductor device having stable structure and method of manufacturing the sameSK HYNIX INC·Filed 2016·Granted Nov 1, 2016·0 cites·11 claims
- 1449US7759232B2Method of forming damascene patterns of semiconductor devicesHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jul 20, 2010·0 cites·6 claims
- 1548US9337091B2Semiconductor device having stable structure and method of manufacturing the sameSK HYNIX INC·Filed 2015·Granted May 10, 2016·0 cites·10 claims
- 1645US2008211037A1Semiconductor Device and Method of Forming Isolation Layer ThereofHYNIX SEMICONDUCTOR INC·Filed 2007·Application pending·0 cites
- 1743US7300844B2Method of forming gate of flash memory deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 27, 2007·0 cites·9 claims
- 1842US7498221B2Method of forming gate of semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Mar 3, 2009·0 cites·7 claims
- 1942US2009096010A1Nonvolatile memory device and fabrication method thereofHYNIX SEMICONDUCTOR·Filed 2007·Application pending·0 cites
- 2040US8143160B2Method of forming a contact plug of a semiconductor deviceHYUN CHAN SUN·Filed 2008·Granted Mar 27, 2012·0 cites·13 claims
- 2136US2008102617A1Method of Fabricating Flash Memory DeviceHYUN CHAN SUN·Filed 2007·Application pending·0 cites
- 2233US2012205805A1Semiconductor device and method of manufacturing the sameHYUN CHAN SUN·Filed 2012·Application pending·0 cites
- 2332US8058160B2Method of forming nonvolatile memory deviceHYUN CHAN SUN·Filed 2010·Granted Nov 15, 2011·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →