Inventor · disambiguated record
Chris R. Jacobsen
Also filed as: JACOBSEN CHRIS · JACOBSEN CHRIS R · JACOBSEN CHRIS RICHARD
17 granted patents·7 pending applications·226 citations·filing 1998–2018
94Inventor score
Files withAGILENT TECHNOLOGIES INC15KEYSIGHT TECHNOLOGIES INC3PARKER KENNETH P3JACOBSEN CHRIS R2WILLIAMSON EDDIE LEE1
Top patents by PatentIndex Score
24 records- 0191US9870333B1Instrumentation chassis including integrated accelerator moduleKEYSIGHT TECHNOLOGIES INC·Filed 2014·Granted Jan 16, 2018·33 cites·20 claims
- 0289US10533809B1Cooling apparatus and methods of useKEYSIGHT TECHNOLOGIES INC·Filed 2018·Granted Jan 14, 2020·13 cites·18 claims
- 0388US7123022B2Method and apparatus for non-contact testing and diagnosing electrical paths through connectors on circuit assembliesAGILENT TECHNOLOGIES INC·Filed 2004·Granted Oct 17, 2006·35 cites·7 claims
- 0484US7307427B2Method and apparatus for engineering a testability interposer for testing sockets and connectors on printed circuit boardsAGILENT TECHNOLOGIES INC·Filed 2005·Granted Dec 11, 2007·15 cites·13 claims
- 0582US6307386B1Modular mechanical fixturing and automated handling of printed circuit assemblies on automated test equipmentAGILENT TECHNOLOGIES INC·Filed 1998·Granted Oct 23, 2001·66 cites·14 claims
- 0675US7259576B2Method and apparatus for a twisting fixture probe for probing test access point structuresAGILENT TECHNOLOGIES INC·Filed 2005·Granted Aug 21, 2007·8 cites·14 claims
- 0768US7295031B1Method for non-contact testing of marginal integrated circuit connectionsAGILENT TECHNOLOGIES INC·Filed 2006·Granted Nov 13, 2007·6 cites·14 claims
- 0867US7325219B2Method and apparatus for determining probing locations for a printed circuit boardAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jan 29, 2008·5 cites·22 claims
- 0967US7208957B2Method for non-contact testing of fixed and inaccessible connections without using a sensor plateAGILENT TECHNOLOGIES INC·Filed 2005·Granted Apr 24, 2007·5 cites·18 claims
- 1064US7307426B2Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devicesAGILENT TECHNOLOGIES INC·Filed 2005·Granted Dec 11, 2007·4 cites·29 claims
- 1158US6664778B2Circuit board coupon testerAGILENT TECHNOLOGIES INC·Filed 2001·Granted Dec 16, 2003·8 cites·20 claims
- 1255US7504589B2Method and apparatus for manufacturing and probing printed circuit board test access point structuresAGILENT TECHNOLOGIES INC·Filed 2004·Granted Mar 17, 2009·5 cites·8 claims
- 1349US7009381B2Adapter method and apparatus for interfacing a tester with a device under testAGILENT TECHNOLOGIES INC·Filed 2003·Granted Mar 7, 2006·6 cites·8 claims
- 1445US2008148208A1Method for improving a printed circuit board development cycleJACOBSEN CHRIS R·Filed 2008·Application pending·0 cites
- 1544US6828778B2Circuit board coupon testerAGILENT TECHNOLOGIES INC·Filed 2003·Granted Dec 7, 2004·3 cites·6 claims
- 1643US2010005123A1Tracking Manufacturing Test ChangesAGILENT TECHNOLOGIES INC·Filed 2008·Application pending·0 cites
- 1742US6191572B1Adjustable fast press with PCA shuttle and modular expansion capabilitiesAGILENT TECHNOLOGIES INC·Filed 1998·Granted Feb 20, 2001·11 cites·15 claims
- 1842US2007007978A1Method and Apparatus for Non-Contact Testing and Diagnosing Electrical Paths Through Connectors on Circuit AssembliesPARKER KENNETH P·Filed 2006·Application pending·0 cites
- 1941US7187165B2Method and system for implicitly encoding preferred probing locations in a printed circuit board design for use in tester fixture buildAGILENT TECHNOLOGIES INC·Filed 2004·Granted Mar 6, 2007·3 cites·14 claims
- 2041US2006103397A1Method and apparatus for a twisting fixture probe for probing test access point structuresPARKER KENNETH P·Filed 2004·Application pending·0 cites
- 2140US2008315892A1Methods and apparatus using one or more supernodes when testing for shorts between nodes of a circuit assemblyPARKER KENNETH P·Filed 2008·Application pending·0 cites
- 2236US2009179657A1Printed circuit board for coupling probes to a tester, and apparatus and test system using sameWILLIAMSON EDDIE LEE·Filed 2008·Application pending·0 cites
- 2336US2006129955A1Printed circuit board development cycle using probe location automation and bead probe technologyJACOBSEN CHRIS R·Filed 2004·Application pending·0 cites
- 2431US10840701B2Instrumentation chassis with single output AC to DC power supply and DC to DC switching regulatorsKEYSIGHT TECHNOLOGIES INC·Filed 2018·Granted Nov 17, 2020·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →