Inventor · disambiguated record
Chang Soo Jang
Also filed as: JANG CHANG SOO
22 granted patents·1 pending application·50 citations·filing 2005–2025
92Inventor score
Files withSAMSUNG ELECTRO MECH7LG DISPLAY CO LTD5SAMSUNG TECHWIN CO LTD5DONGBU ELECTRONICS CO LTD3DONGBU HITEK CO LTD2
Top patents by PatentIndex Score
23 records- 0193US7292138B2Vehicle tire with RFID tagSAMSUNG TECHWIN CO LTD·Filed 2005·Granted Nov 6, 2007·20 cites·20 claims
- 0278US2025273401A1Multilayer electronic componentSAMSUNG ELECTRO MECH·Filed 2025·Application pending·0 cites
- 0377US7470461B2Printed circuit board and method of manufacturing the sameSAMSUNG TECHWIN CO LTD·Filed 2005·Granted Dec 30, 2008·8 cites·13 claims
- 0476US9618781B2Display device and method of manufacturing the sameLG DISPLAY CO LTD·Filed 2013·Granted Apr 11, 2017·2 cites·18 claims
- 0574US12322556B2Multilayer electronic componentSAMSUNG ELECTRO MECH·Filed 2023·Granted Jun 3, 2025·0 cites·15 claims
- 0672US9282666B2Display device and method of manufacturing the sameLG DISPLAY CO LTD·Filed 2013·Granted Mar 8, 2016·3 cites·14 claims
- 0770US10867752B2Capacitor and method of manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2018·Granted Dec 15, 2020·1 cites·18 claims
- 0870US9482900B2Display deviceLG DISPLAY CO LTD·Filed 2013·Granted Nov 1, 2016·3 cites·12 claims
- 0968US7199462B2Substrate for producing semiconductor packagesSAMSUNG TECHWIN CO LTD·Filed 2005·Granted Apr 3, 2007·5 cites·8 claims
- 1067US7615991B2Method for measuring analog channel resistance of a semiconductor device having a gate, a source, a drain, a drain sense and a source senseDONGBU HITEK CO LTD·Filed 2007·Granted Nov 10, 2009·2 cites·4 claims
- 1165US7315174B2Method of measuring flat-band status capacitance of a gate oxide in a MOS transistor deviceDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Jan 1, 2008·2 cites·7 claims
- 1262US7804693B2Printed circuit board having structure for relieving stress concentration, and semiconductor chip package equipped with the sameSAMSUNG TECHWIN CO LTD·Filed 2005·Granted Sep 28, 2010·3 cites·8 claims
- 1361US7489157B2System and method for automatically measuring carrier density distribution by using capacitance-voltage characteristics of a MOS transistor deviceDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Feb 10, 2009·1 cites·9 claims
- 1457US9256093B2Display apparatus and method for manufacturing the sameLG DISPLAY CO LTD·Filed 2013·Granted Feb 9, 2016·0 cites·20 claims
- 1555US7898269B2Semiconductor device and method for measuring analog channel resistance thereofDONGBU HITEK CO LTD·Filed 2009·Granted Mar 1, 2011·0 cites·4 claims
- 1651US7811626B2Printed circuit board and method of manufacturing the sameSAMSUNG TECHWIN CO LTD·Filed 2008·Granted Oct 12, 2010·0 cites·7 claims
- 1750US10811193B2Capacitor componentSAMSUNG ELECTRO MECH·Filed 2018·Granted Oct 20, 2020·0 cites·23 claims
- 1850US9304245B2Display device including a light guide bonded to a display panelLG DISPLAY CO LTD·Filed 2013·Granted Apr 5, 2016·0 cites·16 claims
- 1946US10699845B2Capacitor component and method of manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2018·Granted Jun 30, 2020·0 cites·18 claims
- 2044US10903003B2Capacitor componentSAMSUNG ELECTRO MECH·Filed 2018·Granted Jan 26, 2021·0 cites·20 claims
- 2144US8108185B2Electrostatic discharge voltage resistive current modeling method of electrostatic discharge protection deviceJANG CHANG SOO·Filed 2008·Granted Jan 31, 2012·0 cites·20 claims
- 2243US10755855B2Capacitor and method of manufacturing the sameSAMSUNG ELECTRO MECH·Filed 2018·Granted Aug 25, 2020·0 cites·16 claims
- 2343US7312606B2Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistorDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Dec 25, 2007·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →