Inventor · disambiguated record
Chan See Jean
Also filed as: JEAN CHAN SEE
5 granted patents·1 pending application·32 citations·filing 2022–2024
77Inventor score
Technology areasG01R
Top patents by PatentIndex Score
6 records- 0196US11828795B1Test system with a thermal head comprising a plurality of adapters for independent thermal control of zonesAEM HOLDINGS LTD·Filed 2022·Granted Nov 28, 2023·10 cites·31 claims
- 0296US11796589B1Thermal head for independent control of zonesAEM HOLDINGS LTD·Filed 2022·Granted Oct 24, 2023·4 cites·30 claims
- 0396US11693051B1Thermal head for independent control of zonesAEM HOLDINGS LTD·Filed 2022·Granted Jul 4, 2023·7 cites·30 claims
- 0496US11656272B1Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zonesAEM HOLDINGS LTD·Filed 2022·Granted May 23, 2023·11 cites·25 claims
- 0580US12259427B2Thermal head comprising a plurality of adapters for independent thermal control of zonesAEM SINGAPORE PTE LTD·Filed 2023·Granted Mar 25, 2025·0 cites·22 claims
- 0680US2024329120A1Thermal head comprising a plurality of adapters for independent thermal control of zonesAEM SINGAPORE PTE LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →