Inventor · disambiguated record

Chung-Hsuan Kan

Also filed as: KAN CHUNG-HSUAN

1 granted patent·0 citations·filing 2020–2020

8Inventor score

Technology areasG01R

Files withWINBOND ELECTRONICS CORP1

Top patents by PatentIndex Score

1 record

0144US11821919B2Short-circuit probe card, wafer test system, and fault detection method for the wafer test systemWINBOND ELECTRONICS CORP·Filed 2020·Granted Nov 21, 2023·0 cites·8 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →