Inventor · disambiguated record
Chin Kim
Also filed as: KIM CHIN · KIM CHIN MAN
9 granted patents·87 citations·filing 2000–2024
84Inventor score
Top patents by PatentIndex Score
9 records- 0189US11621914B2Maintaining processing core affinity for fragmented packets in network devicesJUNIPER NETWORKS INC·Filed 2020·Granted Apr 4, 2023·3 cites·18 claims
- 0283US6536022B1Two pole coupling noise analysis model for submicron integrated circuit design verificationSUN MICROSYSTEMS INC·Filed 2000·Granted Mar 18, 2003·39 cites·14 claims
- 0381US6507935B1Method of analyzing crosstalk in a digital logic integrated circuitSUN MICROSYSTEMS INC·Filed 2000·Granted Jan 14, 2003·42 cites·9 claims
- 0472US12273264B1Maintaining processing core affinity for fragmented packets in network devicesJUNIPER NETWORKS INC·Filed 2024·Granted Apr 8, 2025·0 cites·19 claims
- 0569US11949590B1Maintaining processing core affinity for fragmented packets in network devicesJUNIPER NETWORKS INC·Filed 2023·Granted Apr 2, 2024·0 cites·20 claims
- 0663US8179120B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2009·Granted May 15, 2012·3 cites·16 claims
- 0750US9194909B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2012·Granted Nov 24, 2015·0 cites·11 claims
- 0850US9075109B2Single level of metal test structure for differential timing and variability measurements of integrated circuitsBHUSHAN MANJUL·Filed 2012·Granted Jul 7, 2015·0 cites·11 claims
- 0940US9575112B2Test system that performs simultaneous tests of multiple test unitsSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 21, 2017·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →