Inventor · disambiguated record
Chang-Nyun Kim
Also filed as: KIM CHANG-NYUN
5 granted patents·41 citations·filing 2000–2004
79Inventor score
Files withSAMSUNG ELECTRONICS CO LTD5
Top patents by PatentIndex Score
5 records- 0166US6819129B2Method and apparatus for testing a non-standard memory device under actual operating conditionsSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Nov 16, 2004·17 cites·35 claims
- 0259US6771088B2Method and apparatus for testing semiconductor devices using the back side of a circuit boardSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 3, 2004·6 cites·22 claims
- 0358US7075325B2Method and apparatus for testing semiconductor devices using an actual board-type productSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 11, 2006·9 cites·20 claims
- 0453US6833721B2Method and apparatus for testing semiconductor devices using an actual board-type productSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 21, 2004·7 cites·22 claims
- 0548US7256594B2Method and apparatus for testing semiconductor devices using the back side of a circuit boardSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Aug 14, 2007·2 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →