Inventor · disambiguated record
Ching-Hung Lai
Also filed as: LAI CHING-HUNG
6 granted patents·2 pending applications·1 citations·filing 2017–2024
68Inventor score
Top patents by PatentIndex Score
8 records- 0177US12340163B2Photomask and method for manufacturing photomask and semiconductor structure thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 24, 2025·0 cites·20 claims
- 0273US10274817B2Mask and photolithography systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Apr 30, 2019·1 cites·13 claims
- 0368US11669670B2Photomask and method for manufacturing photomask and semiconductor structure thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 6, 2023·0 cites·20 claims
- 0462US2025341481A1Non-destructive surface metrology of patterned wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0558US10867107B2Method for manufacturing photomask and semiconductor thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 15, 2020·0 cites·20 claims
- 0656US11262658B2Photomask, photolithography system and manufacturing processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 1, 2022·0 cites·20 claims
- 0755US2025391114A1Algorithm for 3d reconstruction of diagonally cut semiconductor logic structureAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0852US12498333B2Defect offset correction for examination of semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Granted Dec 16, 2025·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →