Inventor · disambiguated record
Charles Thomas Larson
Also filed as: LARSON CHARLES · LARSON CHARLES THOMAS
8 granted patents·2 pending applications·6 citations·filing 2015–2023
80Inventor score
Top patents by PatentIndex Score
10 records- 0191US11029148B2Feed-forward of multi-layer and multi-process information using XPS and XRF technologiesNOVA MEASURING INSTR INC·Filed 2020·Granted Jun 8, 2021·2 cites·20 claims
- 0289US10648802B2Feed-forward of multi-layer and multi-process information using XPS and XRF technologiesNOVA MEASURING INSTR INC·Filed 2019·Granted May 12, 2020·2 cites·20 claims
- 0383US12158437B2XPS metrology for process control in selective depositionNOVA MEASURING INSTR INC·Filed 2023·Granted Dec 3, 2024·0 cites·12 claims
- 0481US10082390B2Feed-forward of multi-layer and multi-process information using XPS and XRF technologiesREVERA INCORPORATED·Filed 2015·Granted Sep 25, 2018·2 cites·20 claims
- 0581US2024085174A1Feed-forward of multi-layer and multi-process information using xps and xrf technologiesNOVA MEASURING INSTR INC·Filed 2023·Application pending·0 cites
- 0678US11680915B2XPS metrology for process control in selective depositionNOVA MEASURING INSTR INC·Filed 2022·Granted Jun 20, 2023·0 cites·19 claims
- 0773US11733035B2Feed-forward of multi-layer and multi-process information using XPS and XRF technologiesNOVA MEASURING INSTR INC·Filed 2021·Granted Aug 22, 2023·0 cites·7 claims
- 0871US11346795B2XPS metrology for process control in selective depositionNOVA MEASURING INSTR INC·Filed 2020·Granted May 31, 2022·0 cites·20 claims
- 0969US2019033069A1Feed-forward of multi-layer and multi-process information using xps and xrf technologiesNOVA MEASURING INSTR INC·Filed 2018·Application pending·0 cites
- 1064US10801978B2XPS metrology for process control in selective depositionNOVA MEASURING INSTR INC·Filed 2019·Granted Oct 13, 2020·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →