Inventor · disambiguated record
Christian Laue
Also filed as: LAUE CHRISTIAN
11 granted patents·2 pending applications·61 citations·filing 2003–2008
89Inventor score
Files withIBM13
Top patents by PatentIndex Score
13 records- 0189US7505124B2Automated inspection system and methodIBM·Filed 2008·Granted Mar 17, 2009·19 cites·9 claims
- 0282US7693324B2Optical surface inspectionIBM·Filed 2005·Granted Apr 6, 2010·9 cites·22 claims
- 0372US7355700B2Automated inspection system and methodIBM·Filed 2005·Granted Apr 8, 2008·4 cites·5 claims
- 0472US7342654B2Detection of impurities in cylindrically shaped transparent mediaIBM·Filed 2004·Granted Mar 11, 2008·11 cites·18 claims
- 0569US7230763B2Polarizing beamsplitterIBM·Filed 2006·Granted Jun 12, 2007·4 cites·10 claims
- 0668US7397569B2Method and system for interferometric height measurementIBM·Filed 2006·Granted Jul 8, 2008·4 cites·7 claims
- 0758US7221459B2Method and system for interferometric height measurementIBM·Filed 2004·Granted May 22, 2007·6 cites·16 claims
- 0849US7167311B2Polarizing beamsplitterIBM·Filed 2004·Granted Jan 23, 2007·3 cites·22 claims
- 0946US7088453B2Optical device having a rotatable birefringent crystalIBM·Filed 2003·Granted Aug 8, 2006·1 cites·16 claims
- 1045US7551292B2Interferometric Height MeasurementIBM·Filed 2008·Granted Jun 23, 2009·0 cites·7 claims
- 1145US7551291B2Interferometric height measurementIBM·Filed 2008·Granted Jun 23, 2009·0 cites·7 claims
- 1238US2005109746A1Method for fluxless soldering of workpiecesIBM·Filed 2004·Application pending·0 cites
- 1338US2005168750A1Measurement system for determining the thickness of a layer during a plating processIBM·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →