Inventor · disambiguated record
Chu-Mei Lee
Also filed as: LEE CHU M · LEE CHU-MEI
3 granted patents·102 citations·filing 1994–1996
75Inventor score
Technology areasH10P
Top patents by PatentIndex Score
3 records- 0181US5633505ASemiconductor wafer incorporating marks for inspecting first layer overlay shift in global alignment processTAIWAN SEMICONDUCTOR MFG·Filed 1996·Granted May 27, 1997·64 cites·2 claims
- 0274USD365077SLicense plate frameGUAN KUEN ENTPR CORP·Filed 1994·Granted Dec 12, 1995·20 cites·1 claims
- 0353US5545570AMethod of inspecting first layer overlay shift in global alignment processTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted Aug 13, 1996·18 cites·2 claims
Join the waitlist — get patent alerts
Get an alert when Chu-Mei Lee files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →