Inventor · disambiguated record
Chang Yun Lee
Also filed as: LEE CHANG YUN
6 granted patents·9 pending applications·22 citations·filing 2008–2022
76Inventor score
Files withSAMSUNG ELECTRO MECH7SAMSUNG ELECTRONICS CO LTD4KIM SANG HWA1LEE CHANG YUN1SUNG DOUG-YONG1
Top patents by PatentIndex Score
15 records- 0192US10196738B2Deposition process monitoring system, and method of controlling deposition process and method of fabricating semiconductor device using the systemSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 5, 2019·11 cites·20 claims
- 0280US7715529B1X-ray tubeSAMSUNG ELECTRO MECH·Filed 2009·Granted May 11, 2010·6 cites·5 claims
- 0371US10541182B2Method of inspecting semiconductor substrate and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jan 21, 2020·2 cites·17 claims
- 0461US7921674B2Method of manufacturing optical waveguide using optical solitonSAMSUNG ELECTRO MECH·Filed 2008·Granted Apr 12, 2011·3 cites·9 claims
- 0557US2023207185A1Coil componentSAMSUNG ELECTRO MECH·Filed 2022·Application pending·0 cites
- 0650US9362091B2Substrate treating apparatus and blocker plate assemblySAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jun 7, 2016·0 cites·12 claims
- 0747US7991037B2Multi-beam laser apparatusSAMSUNG ELECTRO MECH·Filed 2008·Granted Aug 2, 2011·0 cites·9 claims
- 0842US2008304136A1Optical parametric oscillatorSAMSUNG ELECTRO MECH·Filed 2008·Application pending·0 cites
- 0942US2008259973A1Wavelength converted laser apparatusSAMSUNG ELECTRO MECH·Filed 2008·Application pending·0 cites
- 1041US2010009097A1Deposition Apparatus and Deposition Method Using the SameSUNG DOUG-YONG·Filed 2009·Application pending·0 cites
- 1140US2020194235A1Apparatus for manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 1240US2011057278A1X-ray detector using liquid crystal deviceKIM SANG HWA·Filed 2009·Application pending·0 cites
- 1337US2009091737A1Laser measuring deviceSAMSUNG ELECTRO MECH·Filed 2008·Application pending·0 cites
- 1435US2013100460A1Apparatus for measuring warpage characteristic of specimenWOO SEUNG WAN·Filed 2012·Application pending·0 cites
- 1529US2012176623A1Apparatus and method for measuring characteristics of multi-layered thin filmsLEE CHANG YUN·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Chang Yun Lee files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →