Inventor · disambiguated record
Chahn Lee
Also filed as: LEE CHAHN
12 granted patents·2 pending applications·42 citations·filing 2003–2021
88Inventor score
Top patents by PatentIndex Score
14 records- 0192US9697987B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jul 4, 2017·9 cites·11 claims
- 0291US10720306B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 21, 2020·4 cites·12 claims
- 0390US10249474B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Apr 2, 2019·4 cites·10 claims
- 0484US7105246B2Catalytic material, electrode, and fuel cell using the sameHIATCHI LTD·Filed 2005·Granted Sep 12, 2006·5 cites·3 claims
- 0579US11133147B2Charged particle ray device and cross-sectional shape estimation programHITACHI HIGH TECH CORP·Filed 2018·Granted Sep 28, 2021·2 cites·12 claims
- 0679US9786468B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 10, 2017·4 cites·12 claims
- 0778US11798780B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 24, 2023·0 cites·5 claims
- 0878US9472376B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 18, 2016·4 cites·10 claims
- 0975US7108939B2Covalently bonded catalyst carrier and catalytic componentHITACHI LTD·Filed 2003·Granted Sep 19, 2006·10 cites·3 claims
- 1073US11239052B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 1, 2022·0 cites·3 claims
- 1147US10290464B2Charged particle beam device and pattern measurement deviceHITACHI HIGH TECH CORP·Filed 2016·Granted May 14, 2019·0 cites·12 claims
- 1247US2004050974A1Valve-encased nozzle device and liquid handling deviceFiled 2003·Application pending·0 cites
- 1342US2019103250A1Charged Particle Beam DeviceHITACHI HIGH TECH CORP·Filed 2018·Application pending·0 cites
- 1441US9257259B2Electron beam irradiation method and scanning electronic microscopeKOBAYASHI KINYA·Filed 2011·Granted Feb 9, 2016·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →