Inventor · disambiguated record
Chih-Chieh Liao
Also filed as: LIAO CHIH-CHIEH
21 granted patents·8 pending applications·12 citations·filing 2015–2025
89Inventor score
Files withGLOBAL UNICHIP CORP29
Top patents by PatentIndex Score
29 records- 0195US11340288B1Testing equipment, its component carrying device and testing method of the testing equipmentGLOBAL UNICHIP CORP·Filed 2021·Granted May 24, 2022·3 cites·19 claims
- 0288US10154612B1Electronic device having active heat dissipationGLOBAL UNICHIP CORP·Filed 2018·Granted Dec 11, 2018·6 cites·10 claims
- 0372US10274516B2Probe card system, probe loader device and manufacturing method of the probe loader deviceGLOBAL UNICHIP CORP·Filed 2017·Granted Apr 30, 2019·1 cites·9 claims
- 0471US10566217B2Drying apparatusGLOBAL UNICHIP CORP·Filed 2018·Granted Feb 18, 2020·1 cites·10 claims
- 0570US10502775B2Testing equipment for semiconductor element and its carrying deviceGLOBAL UNICHIP CORP·Filed 2017·Granted Dec 10, 2019·1 cites·10 claims
- 0668US12140623B2Testing apparatusGLOBAL UNICHIP CORP·Filed 2023·Granted Nov 12, 2024·0 cites·20 claims
- 0766US2025370035A1Heterogeneous thermal interface material element and pressing test device having the sameGLOBAL UNICHIP CORP·Filed 2025·Application pending·0 cites
- 0865US11703244B2Testing apparatusGLOBAL UNICHIP CORP·Filed 2020·Granted Jul 18, 2023·0 cites·17 claims
- 0965US11624759B1Inspecting device and its testing socketGLOBAL UNICHIP CORP·Filed 2022·Granted Apr 11, 2023·0 cites·20 claims
- 1062US2025277810A1Testing apparatus and its conductive terminalGLOBAL UNICHIP CORP·Filed 2024·Application pending·0 cites
- 1161US2025277812A1Testing apparatus of packaged modules and its manufacturing methodGLOBAL UNICHIP CORP·Filed 2024·Application pending·0 cites
- 1260US11852470B2Inspecting deviceGLOBAL UNICHIP CORP·Filed 2020·Granted Dec 26, 2023·0 cites·20 claims
- 1360US2025026029A1Element pickup mechanismGLOBAL UNICHIP CORP·Filed 2023·Application pending·0 cites
- 1454US12484149B2Electric device, its circuit board and method of manufacturing the electric deviceGLOBAL UNICHIP CORP·Filed 2022·Granted Nov 25, 2025·0 cites·8 claims
- 1554US11740260B2Pogo pin-free testing device for IC chip test and testing method of IC chipGLOBAL UNICHIP CORP·Filed 2022·Granted Aug 29, 2023·0 cites·11 claims
- 1654US11156639B2Probe card moduleGLOBAL UNICHIP CORP·Filed 2020·Granted Oct 26, 2021·0 cites·10 claims
- 1753US10598724B2Testing system for semiconductor package components and its thermal barrier layer elementGLOBAL UNICHIP CORP·Filed 2017·Granted Mar 24, 2020·0 cites·15 claims
- 1853US10041817B2Damping component and integrated-circuit testing apparatus using the sameGLOBAL UNICHIP CORP·Filed 2017·Granted Aug 7, 2018·0 cites·9 claims
- 1952US12243703B2Probe card device and circuit protection assembly thereofGLOBAL UNICHIP CORP·Filed 2022·Granted Mar 4, 2025·0 cites·18 claims
- 2052US11848250B2Thermal peak suppression deviceGLOBAL UNICHIP CORP·Filed 2021·Granted Dec 19, 2023·0 cites·11 claims
- 2152US9678110B2Probe cardGLOBAL UNICHIP CORP·Filed 2015·Granted Jun 13, 2017·0 cites·10 claims
- 2251US10132835B2Testing apparatus and its probe connectorGLOBAL UNICHIP CORP·Filed 2016·Granted Nov 20, 2018·0 cites·16 claims
- 2351US2023333141A1Conductive probe, method of manufacturing the same, and probe card device having the sameGLOBAL UNICHIP CORP·Filed 2022·Application pending·0 cites
- 2447US10048290B2Probe card deviceGLOBAL UNICHIP CORP·Filed 2016·Granted Aug 14, 2018·0 cites·15 claims
- 2547US2022291256A1Testing apparatus and its element pickup moduleGLOBAL UNICHIP CORP·Filed 2021·Application pending·0 cites
- 2646US11699457B2Testing system, crack noise monitoring device and method for monitoring crack noiseGLOBAL UNICHIP CORP·Filed 2021·Granted Jul 11, 2023·0 cites·18 claims
- 2735US2017045554A1Circuit probing system and its circuit probing deviceGLOBAL UNICHIP CORP·Filed 2015·Application pending·0 cites
- 2835US2017052218A1Testing unit and testing apparatus using the sameGLOBAL UNICHIP CORP·Filed 2016·Application pending·0 cites
- 2932US10332765B1Wafer shipping deviceGLOBAL UNICHIP CORP·Filed 2018·Granted Jun 25, 2019·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →