Inventor · disambiguated record
Chuen-Der Lien
Also filed as: LIEN CHUEN-DER
153 granted patents·3 pending applications·4,033 citations·filing 1989–2024
99Inventor score
Files withINTEGRATED DEVICE TECH123WINBOND ELECTRONICS CORP21INTEGRATED DEVICES TECHNOLOGY3INTEGRATED DEVICE TECHNOLOGY2NETLOGIC MICROSYSTEMS INC2
Top patents by PatentIndex Score
156 records- 0199US6563754B1DRAM circuit with separate refresh memoryINTEGRATED DEVICE TECH·Filed 2001·Granted May 13, 2003·479 cites·20 claims
- 0297US7102862B1Electrostatic discharge protection circuitINTEGRATED DEVICE TECH·Filed 2002·Granted Sep 5, 2006·146 cites·33 claims
- 0396US7304875B1Content addressable memory (CAM) devices that support background BIST and BISR operations and methods of operating sameINTEGRATED DEVICE TECH·Filed 2005·Granted Dec 4, 2007·51 cites·8 claims
- 0495US7877657B1Look-ahead built-in self testsINTEGRATED DEVICE TECH·Filed 2007·Granted Jan 25, 2011·32 cites·20 claims
- 0594US11114180B1Non-volatile memory deviceWINBOND ELECTRONICS CORP·Filed 2020·Granted Sep 7, 2021·5 cites·19 claims
- 0694US6700827B2Cam circuit with error correctionINTEGRATED DEVICE TECH·Filed 2002·Granted Mar 2, 2004·77 cites·20 claims
- 0794US6262907B1Ternary CAM arrayINTEGRATED DEVICE TECH·Filed 2000·Granted Jul 17, 2001·84 cites·32 claims
- 0893US7941723B1Clock generator and method for providing reliable clock signal using array of MEMS resonatorsINTEGRATED DEVICE TECH·Filed 2007·Granted May 10, 2011·30 cites·20 claims
- 0993US7706113B1Electrical overstress (EOS) and electrostatic discharge (ESD) protection circuit and method of useINTEGRATED DEVICE TECH·Filed 2007·Granted Apr 27, 2010·27 cites·20 claims
- 1093US7582567B1Method for forming CMOS device with self-aligned contacts and region formed using salicide processINTEGRATED DEVICE TECH·Filed 2006·Granted Sep 1, 2009·26 cites·20 claims
- 1192US6421265B1DRAM-based CAM cell using 3T or 4T DRAM cellsINTEGRATED DEVICES TECHNOLOGY·Filed 2001·Granted Jul 16, 2002·84 cites·26 claims
- 1291US8028211B1Look-ahead built-in self tests with temperature elevation of functional elementsINTEGRATED DEVICE TECH·Filed 2008·Granted Sep 27, 2011·19 cites·27 claims
- 1391US6781857B1Content addressable memory (CAM) devices that utilize multi-port CAM cells and control logic to support multiple overlapping search cycles that are asynchronously timed relative to each otherINTEGRATED DEVICE TECH·Filed 2002·Granted Aug 24, 2004·64 cites·32 claims
- 1491US6256216B1Cam array with minimum cell sizeINTEGRATED DEVICE TECH·Filed 2000·Granted Jul 3, 2001·61 cites·12 claims
- 1590US12212338B1Syndrome decoder circuitWINBOND ELECTRONICS CORP·Filed 2023·Granted Jan 28, 2025·2 cites·19 claims
- 1690US7602226B1Method and apparatus for clock generationINTEGRATED DEVICE TECH·Filed 2006·Granted Oct 13, 2009·19 cites·5 claims
- 1790US7214990B1Memory cell with reduced soft error rateINTEGRATED DEVICE TECH·Filed 2005·Granted May 8, 2007·20 cites·11 claims
- 1890US6373739B1Quad CAM cell with minimum cell sizeINTEGRATED DEVICE TECH·Filed 2000·Granted Apr 16, 2002·58 cites·20 claims
- 1990US6205049B1Five-transistor SRAM cellINTEGRATED DEVICE TECH·Filed 1999·Granted Mar 20, 2001·80 cites·20 claims
- 2089US10783973B1Memory device having parameter adjusting mechanism and method of adjusting parameter by memory deviceWINBOND ELECTRONICS CORP·Filed 2019·Granted Sep 22, 2020·6 cites·20 claims
- 2189US6879504B1Content addressable memory (CAM) devices having error detection and correction control circuits therein and methods of operating sameINTEGRATED DEVICE TECH·Filed 2003·Granted Apr 12, 2005·42 cites·70 claims
- 2289US6222212B1Semiconductor device having programmable interconnect layersINTEGRATED DEVICE TECH·Filed 1996·Granted Apr 24, 2001·133 cites·19 claims
- 2389US6128207ALow-power content addressable memory cellINTEGRATED DEVICE TECH·Filed 1998·Granted Oct 3, 2000·67 cites·32 claims
- 2489US6069782AESD damage protection using a clamp circuitINTEGRATED DEVICE TECH·Filed 1998·Granted May 30, 2000·85 cites·19 claims
- 2588US7408751B1Self-biased electrostatic discharge protection method and circuitINTEGRATED DEVICE TECH·Filed 2005·Granted Aug 5, 2008·18 cites·32 claims
- 2688US7050317B1Content addressable memory (CAM) devices that support power saving longest prefix match operations and methods of operating sameINTEGRATED DEVICE TECH·Filed 2004·Granted May 23, 2006·46 cites·22 claims
- 2788US6570405B1Integrated output driver circuits having current sourcing and current sinking characteristics that inhibit power bounce and ground bounceINTEGRATED DEVICE TECH·Filed 2001·Granted May 27, 2003·34 cites·56 claims
- 2888US5793088AStructure for controlling threshold voltage of MOSFETINTEGRATED DEVICE TECH·Filed 1996·Granted Aug 11, 1998·98 cites·21 claims
- 2987US6657878B2Content addressable memory (CAM) devices having reliable column redundancy characteristics and methods of operating sameINTEGRATED DEVICE TECH·Filed 2002·Granted Dec 2, 2003·42 cites·48 claims
- 3086US9836349B2Methods and systems for detecting and correcting errors in nonvolatile memoryWINBOND ELECTRONICS CORP·Filed 2015·Granted Dec 5, 2017·5 cites·23 claims
- 3186US7644311B2Logic soft error rate prediction and improvementINTEGRATED DEVICE TECH·Filed 2006·Granted Jan 5, 2010·16 cites·20 claims
- 3286US6870749B1Content addressable memory (CAM) devices with dual-function check bit cells that support column redundancy and check bit cells with reduced susceptibility to soft errorsINTEGRATED DEVICE TECH·Filed 2003·Granted Mar 22, 2005·43 cites·14 claims
- 3386US6560156B2CAM circuit with radiation resistanceINTEGRATED DEVICE TECH·Filed 2002·Granted May 6, 2003·39 cites·22 claims
- 3485US6400593B1Ternary CAM cell with DRAM mask circuitINTREGRATED DEVICE TECHNOLOGY·Filed 2001·Granted Jun 4, 2002·45 cites·21 claims
- 3585US5723822AStructure for fabricating a bonding pad having improved adhesion to an underlying structureINTEGRATED DEVICE TECH·Filed 1995·Granted Mar 3, 1998·69 cites·18 claims
- 3684US6266263B1CAM array with minimum cell sizeINTEGRATED DEVICE TECH·Filed 2000·Granted Jul 24, 2001·37 cites·36 claims
- 3784US5888861AMethod of manufacturing a BiCMOS integrated circuit fully integrated within a CMOS process flowINTEGRATED DEVICE TECH·Filed 1997·Granted Mar 30, 1999·61 cites·29 claims
- 3884US5310700AConductor capacitance reduction in integrated circuitsINTEGRATED DEVICE TECH·Filed 1993·Granted May 10, 1994·101 cites·6 claims
- 3983US6661687B1Cam circuit with separate memory and logic operating voltagesINTEGRATED DEVICE TECH·Filed 2003·Granted Dec 9, 2003·29 cites·26 claims
- 4083US5831899ALocal interconnect structure and process for six-transistor SRAM cellINTEGRATED DEVICE TECH·Filed 1997·Granted Nov 3, 1998·42 cites·11 claims
- 4181US7499303B2Binary and ternary non-volatile CAMINTEGRATED DEVICE TECH·Filed 2004·Granted Mar 3, 2009·30 cites·9 claims
- 4281US7176738B1Method and apparatus for clock generationINTEGRATED DEVICE TECH·Filed 2004·Granted Feb 13, 2007·30 cites·8 claims
- 4381US6534414B1Dual-mask etch of dual-poly gate in CMOS processingINTEGRATED DEVICE TECH·Filed 2000·Granted Mar 18, 2003·33 cites·31 claims
- 4481US5989991AMethods for fabricating a bonding pad having improved adhesion to an underlying structureINTEGRATED DEVICE TECH·Filed 1997·Granted Nov 23, 1999·53 cites·6 claims
- 4580US10811092B1RRAM with plurality of 1TnR structuresWINBOND ELECTRONICS CORP·Filed 2019·Granted Oct 20, 2020·4 cites·20 claims
- 4679US7098114B1Method for forming cmos device with self-aligned contacts and region formed using salicide processINTEGRATED DEVICE TECH·Filed 2004·Granted Aug 29, 2006·22 cites·9 claims
- 4779US6031267ACompact static RAM cellINTEGRATED DEVICE TECH·Filed 1998·Granted Feb 29, 2000·38 cites·19 claims
- 4879US6025260AMethod for fabricating air gap with borderless contactINTEGRATED DEVICE TECH·Filed 1998·Granted Feb 15, 2000·51 cites·6 claims
- 4979US5514613AParallel manufacturing of semiconductor devices and the resulting structureINTEGRATED DEVICE TECHNOLOGY·Filed 1994·Granted May 7, 1996·76 cites·19 claims
- 5078US6307399B1High speed buffer circuit with improved noise immunityINTEGRATED DEVICE TECH·Filed 1998·Granted Oct 23, 2001·34 cites·17 claims
Showing the top 50 of 156 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →