Inventor · disambiguated record
Chihiro Manri
Also filed as: MANRI CHIHIRO
11 granted patents·5 pending applications·23 citations·filing 2009–2024
84Inventor score
Top patents by PatentIndex Score
16 records- 0185US9476893B2Automatic analysis device and analysis methodMITSUYAMA SATOSHI·Filed 2010·Granted Oct 25, 2016·8 cites·18 claims
- 0280US9494525B2Automated analyzer and automated analysis methodHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 15, 2016·4 cites·13 claims
- 0379US9310388B2Automatic analyzer and analysis methodKAMIHARA KUMIKO·Filed 2010·Granted Apr 12, 2016·4 cites·10 claims
- 0472US9239281B2Method and device for dividing area of image of particle in urineMANRI CHIHIRO·Filed 2009·Granted Jan 19, 2016·4 cites·9 claims
- 0571US8831306B2Flow type particle image analysis method and deviceMANRI CHIHIRO·Filed 2010·Granted Sep 9, 2014·2 cites·10 claims
- 0664US2024288372A1Gene analysis method and kit for gene analysisHITACHI LTD·Filed 2024·Application pending·0 cites
- 0763US9110019B2Analytical apparatus and analytical methodMITSUYAMA SATOSHI·Filed 2011·Granted Aug 18, 2015·1 cites·4 claims
- 0861US2025341468A1Gene analysis method, gene analysis apparatus, and gene analysis kitHITACHI LTD·Filed 2023·Application pending·0 cites
- 0959US2025060334A1Method for detecting structural polymorphism mutationsHITACHI LTD·Filed 2022·Application pending·0 cites
- 1049US2020393331A1Tissue-embedded section manufacturing method and tissue-embedded section manufacturing apparatusHITACHI LTD·Filed 2020·Application pending·0 cites
- 1148US11427850B2Microorganism testHITACHI LTD·Filed 2019·Granted Aug 30, 2022·0 cites·5 claims
- 1245US9562917B2Automatic analysis device and automatic analysis programMANRI CHIHIRO·Filed 2012·Granted Feb 7, 2017·0 cites·11 claims
- 1340US10203277B2Automatic analysis device and automatic analysis methodMANRI CHIHIRO·Filed 2011·Granted Feb 12, 2019·0 cites·12 claims
- 1440US9488667B2Automatic analyzerKAMIHARA KUMIKO·Filed 2010·Granted Nov 8, 2016·0 cites·22 claims
- 1538US10352864B2Automatic analyzer for identifying a cause of abnormalities of measurement resultsKAMIHARA KUMIKO·Filed 2011·Granted Jul 16, 2019·0 cites·5 claims
- 1638US2012134559A1Particle image analysis apparatusSUZUKI AKIKO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →