Inventor · disambiguated record
Charles Meyer
Also filed as: MEYER CHARLES · MEYER CHARLES R · MEYER CHARLES RUDOLPH
9 granted patents·4 pending applications·310 citations·filing 1975–2019
89Inventor score
Top patents by PatentIndex Score
13 records- 0192US5705814AScanning probe microscope having automatic probe exchange and alignmentDIGITAL INSTR INC·Filed 1995·Granted Jan 6, 1998·183 cites·75 claims
- 0285US7665349B2Method and apparatus for rapid automatic engagement of a probeVEECO INSTR INC·Filed 2005·Granted Feb 23, 2010·13 cites·36 claims
- 0385US4202215ASonic pulse-echo method and apparatus for determining attenuation coefficientsORBAN CO INC KURT·Filed 1978·Granted May 13, 1980·48 cites·44 claims
- 0477US10175263B2Sample vessel retention structure for scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Jan 8, 2019·1 cites·23 claims
- 0577US9081028B2Scanning probe microscope with improved feature location capabilitiesBRUKER NANO INC·Filed 2013·Granted Jul 14, 2015·3 cites·31 claims
- 0669US5314254AStiffness enhancer for movable stage assemblyDIGITAL INSTR·Filed 1992·Granted May 24, 1994·25 cites·31 claims
- 0761US4408724APulverizer device for handling liquids containing solid and semi-solid materialsMEYER CHARLES R·Filed 1982·Granted Oct 11, 1983·16 cites·15 claims
- 0858US2019212361A1Sample vessel retention structure for scanning probe microscopeBRUKER NANO INC·Filed 2019·Application pending·0 cites
- 0954US8782811B2Cleaning station for atomic force microscopeKINDT JOHANNES H·Filed 2012·Granted Jul 15, 2014·1 cites·12 claims
- 1048US2005121615A1Cantilever array sensor systemFiled 2004·Application pending·0 cites
- 1147US3970785ATone count audiometric computerUS AIR FORCE·Filed 1975·Granted Jul 20, 1976·20 cites·9 claims
- 1244US2014230508A1Straightening apparatusMEYER CHARLES RUDOLPH·Filed 2012·Application pending·0 cites
- 1343US2002092340A1Cantilever array sensor systemVEECO INSTR INC·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →