Inventor · disambiguated record
Christoph Nolscher
Also filed as: NOELSCHER CHRISTOPH · NOLSCHER CHRISTOPH
19 granted patents·6 pending applications·351 citations·filing 1996–2008
94Inventor score
Top patents by PatentIndex Score
25 records- 0190US7286207B2Exposing a semiconductor wafer using two different spectral wavelengths and adjusting for chromatic aberrationINFINEON TECHNOLOGIES AG·Filed 2005·Granted Oct 23, 2007·14 cites·20 claims
- 0284US6730463B2Method for determining and removing phase conflicts on alternating phase masksINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 4, 2004·29 cites·5 claims
- 0382US6162556AMethod for operating a high-temperature fuel cell installation, and a high-temperature fuel cell installationSIEMENS AG·Filed 1998·Granted Dec 19, 2000·89 cites·18 claims
- 0480US6010798APEM fuel cellSIEMENS AG·Filed 1996·Granted Jan 4, 2000·70 cites·14 claims
- 0577US7368385B2Method for producing a structure on the surface of a substrateINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 6, 2008·5 cites·18 claims
- 0672US7867912B2Methods of manufacturing semiconductor structuresQIMONDA AG·Filed 2007·Granted Jan 11, 2011·4 cites·34 claims
- 0772US7011936B2Photomask and method of structuring a photoresist by double exposure with imaging auxiliary structures and different exposure toolsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 14, 2006·13 cites·12 claims
- 0872US6680151B2Alternating phase maskINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jan 20, 2004·14 cites·7 claims
- 0968US6080502AFluid-cooled fuel cell with distribution ductsSIEMENS AKTENGESELLSCHAFT·Filed 1996·Granted Jun 27, 2000·43 cites·13 claims
- 1063US7207030B2Method for improving a simulation model of photolithographic projectionINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 17, 2007·10 cites·10 claims
- 1156US7443484B2Method for exposing a semiconductor wafer by applying periodic movement to a componentINFINEON TECHNOLOGIES AG·Filed 2005·Granted Oct 28, 2008·1 cites·15 claims
- 1255US6162554AMethod and system for utilizing enthalpy contained in exhaust gases of low-temperature fuel cellsSIEMENS AG·Filed 1997·Granted Dec 19, 2000·29 cites·15 claims
- 1355US5976722AProcess for operating a fuel cell installation and fuel cell installation for carrying out the processSIEMENS AKTIENGESELLSCHATF·Filed 1998·Granted Nov 2, 1999·29 cites·10 claims
- 1454US8003538B2Method for producing a structure on the surface of a substrateQIMONDA AG·Filed 2008·Granted Aug 23, 2011·0 cites·22 claims
- 1544US6569772B2Method for producing an alternating phase maskINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 27, 2003·1 cites·8 claims
- 1643US2007075276A1Exposure system and method for operating an exposure systemNOLSCHER CHRISTOPH·Filed 2006·Application pending·0 cites
- 1740US7491474B2Masks for lithographic imagings and methods for fabricating the sameINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 17, 2009·0 cites·27 claims
- 1840US2005287446A1Method for the photolithographic projection of a pattern onto a semiconductor wafer with an alternating phase maskNOLSCHER CHRISTOPH·Filed 2005·Application pending·0 cites
- 1939US7361434B2Phase shift maskINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 22, 2008·0 cites·14 claims
- 2039US7070887B2Photolithographic maskINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jul 4, 2006·0 cites·15 claims
- 2139US2006210887A1Lithography mask and methods for producing a lithography maskINFINEON TECHNOLOGIES AG·Filed 2006·Application pending·0 cites
- 2239US2005196689A1Method for transferring a layout of an integrated circuit level to a semiconductor substrateFiled 2005·Application pending·0 cites
- 2338US7297468B2Method for forming a structure element on a wafer by means of a mask and a trimming mask assigned heretoINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 20, 2007·0 cites·15 claims
- 2438US2006190850A1Method for optimizing the geometry of structural elements of a circuit design pattern and method for producing a photomaskKOHLE RODERICK·Filed 2006·Application pending·0 cites
- 2535US2006256313A1Photolithographic imaging device and apparatus for generating an illumination distributionRENNER KERSTIN·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →