Inventor · disambiguated record
Chidane Ouchi
Also filed as: OUCHI CHIDANE
24 granted patents·3 pending applications·284 citations·filing 1990–2015
96Inventor score
Top patents by PatentIndex Score
27 records- 0198US8009797B2X-ray imaging apparatus, X-ray imaging method, and X-ray imaging programCANON KK·Filed 2010·Granted Aug 30, 2011·53 cites·19 claims
- 0297US9063055B2X-ray imaging apparatusOUCHI CHIDANE·Filed 2012·Granted Jun 23, 2015·35 cites·15 claims
- 0397US8559594B2Imaging apparatus and imaging methodOUCHI CHIDANE·Filed 2011·Granted Oct 15, 2013·36 cites·12 claims
- 0488US8995613B2X-ray imaging apparatusOUCHI CHIDANE·Filed 2011·Granted Mar 31, 2015·8 cites·9 claims
- 0586US9066704B2X-ray imaging apparatusDEN TORU·Filed 2012·Granted Jun 30, 2015·8 cites·12 claims
- 0682US9107637B2X-ray imaging apparatus and wavefront measuring apparatusOUCHI CHIDANE·Filed 2011·Granted Aug 18, 2015·7 cites·14 claims
- 0780US8340243B2X-ray imaging apparatus, X-ray imaging method, and X-ray imaging programOUCHI CHIDANE·Filed 2011·Granted Dec 25, 2012·4 cites·13 claims
- 0879US6661522B2Interference system and semiconductor exposure apparatus having the sameCANON KK·Filed 2001·Granted Dec 9, 2003·20 cites·16 claims
- 0978US8537966B2X-ray imaging apparatus, X-ray imaging method, and X-ray imaging programCANON KK·Filed 2012·Granted Sep 17, 2013·3 cites·20 claims
- 1074US9046466B2X-ray imaging apparatusOUCHI CHIDANE·Filed 2011·Granted Jun 2, 2015·7 cites·12 claims
- 1173US6774982B2Exposure apparatus and device manufacturing method using the sameCANON KK·Filed 2001·Granted Aug 10, 2004·12 cites·13 claims
- 1268US5067811AIlluminance distribution measuring systemCANON KK·Filed 1990·Granted Nov 26, 1991·32 cites·32 claims
- 1366US7952726B2Measurement apparatus, exposure apparatus having the same, and device manufacturing methodCANON KK·Filed 2007·Granted May 31, 2011·2 cites·5 claims
- 1464US7253907B2Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing methodCANON KK·Filed 2004·Granted Aug 7, 2007·7 cites·12 claims
- 1564US7106452B2Measuring device and measuring methodCANON KK·Filed 2001·Granted Sep 12, 2006·10 cites·11 claims
- 1661US8077391B2Wavefront aberration measuring method, mask, wavefront aberration measuring device, exposure apparatus, and device manufacturing methodOUCHI CHIDANE·Filed 2009·Granted Dec 13, 2011·1 cites·3 claims
- 1761US8004691B2Measuring apparatus, exposure apparatus and method, and device manufacturing methodCANON KK·Filed 2006·Granted Aug 23, 2011·3 cites·12 claims
- 1859US6721056B1Surface shape measuring apparatus and methodCANON KK·Filed 2000·Granted Apr 13, 2004·9 cites·32 claims
- 1958US9043182B2Absolute position measurement apparatus and methodSEO YUZO·Filed 2008·Granted May 26, 2015·3 cites·9 claims
- 2056US6322220B1Exposure apparatus and device manufacturing method using the sameCANON KK·Filed 1997·Granted Nov 27, 2001·20 cites·5 claims
- 2154US8520217B2Talbot interferometer, its adjustment method, and measurement methodNAOI TOSHIYUKI·Filed 2010·Granted Aug 27, 2013·2 cites·2 claims
- 2254US2015279497A1X-ray imaging apparatusCANON KK·Filed 2015·Application pending·0 cites
- 2349US6853442B2Projection exposure apparatus and device manufacturing method that change a resonator length of a continuous emission excimer laserCANON KK·Filed 2001·Granted Feb 8, 2005·2 cites·10 claims
- 2447US2009268188A1Exposure apparatus and device manufacturing methodCANON KK·Filed 2009·Application pending·0 cites
- 2546US2014270060A1X-ray talbot interferometer and x-ray talbot imaging systemCANON KK·Filed 2014·Application pending·0 cites
- 2643US6961132B2Interference system and semiconductor exposure apparatus having the sameCANON KK·Filed 2003·Granted Nov 1, 2005·0 cites·6 claims
- 2738US8351050B2Wavefront-aberration-measuring device and exposure apparatusCANON KK·Filed 2010·Granted Jan 8, 2013·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →