Inventor · disambiguated record
Chul-Sung Park
Also filed as: PARK CHUL · PARK CHUL-SUNG
40 granted patents·6 pending applications·510 citations·filing 1995–2018
98Inventor score
Top patents by PatentIndex Score
46 records- 0196US9658738B1Representation management on an electronic deviceAMAZON TECH INC·Filed 2012·Granted May 23, 2017·39 cites·27 claims
- 0294US6958947B2Semiconductor memory device with internal voltage generators for testing a memory array and peripheral circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Oct 25, 2005·92 cites·20 claims
- 0393US9076548B1Semiconductor memory device including refresh control circuit and method of refreshing the samePARK DUK-HA·Filed 2013·Granted Jul 7, 2015·22 cites·20 claims
- 0492US7362128B2Programmable impedance control circuit in semiconductor device and impedance range shifting method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 22, 2008·31 cites·9 claims
- 0592US7327630B2Memory cell power switching circuit in semiconductor memory device and method for applying memory cell power voltageSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 5, 2008·28 cites·19 claims
- 0691US9588840B2Memory devices that perform masked write operations and methods of operating the sameCHUNG HOI-JU·Filed 2014·Granted Mar 7, 2017·19 cites·30 claims
- 0788US7203024B2Method of testing servo burst signals of hard disk drive and recording medium adapted thereforSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 10, 2007·10 cites·22 claims
- 0884US9164834B2Semiconductor memory devices, memory systems including the same and method of writing data in the sameCHUNG HOI-JU·Filed 2014·Granted Oct 20, 2015·8 cites·34 claims
- 0984US7379355B2Circuit for enabling sense amplifier and semiconductor memory device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted May 27, 2008·15 cites·20 claims
- 1083US9047929B2Memory system having memory ranks and related tuning methodSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Jun 2, 2015·7 cites·11 claims
- 1182US8638626B2Row address control circuit semiconductor memory device including the same and method of controlling row addressYANG HUI-KAP·Filed 2011·Granted Jan 28, 2014·11 cites·18 claims
- 1282US6822330B2Semiconductor integrated circuit device with test element group circuitSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 23, 2004·24 cites·15 claims
- 1381US10067681B2Memory chip, memory system, and method of accessing the memory chipPARK CHUL SUNG·Filed 2012·Granted Sep 4, 2018·8 cites·11 claims
- 1480US5835400AFerroelectric memory devices having nondestructive read capability and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 10, 1998·47 cites·10 claims
- 1579US6747885B2Ternary content addressable memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 8, 2004·27 cites·29 claims
- 1678US9135981B2Memory system having memory ranks and related tuning methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Sep 15, 2015·4 cites·9 claims
- 1776US7902871B2Level shifter and semiconductor device having off-chip driverSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Mar 8, 2011·4 cites·6 claims
- 1875US7105917B2Semiconductor device having a fuse connected to a pad and fabrication method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Sep 12, 2006·24 cites·6 claims
- 1974US7288966B2Programmable impedance controller and method for operatingSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 30, 2007·8 cites·10 claims
- 2071US10318469B2Semiconductor memory device, memory system, and method using bus-invert encodingSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 11, 2019·2 cites·17 claims
- 2171US5576639ABICMOS level shifter of a semiconductor integrated circuit and data output buffer using the sameSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Nov 19, 1996·25 cites·22 claims
- 2270US10985139B2Semiconductor chip for sensing temperature and semiconductor system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 20, 2021·1 cites·20 claims
- 2368US9830083B2Memory chip, memory system, and method of accessing the memory chipSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Nov 28, 2017·1 cites·20 claims
- 2468US7499310B2Bit line voltage supply circuit in semiconductor memory device and voltage supplying method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Mar 3, 2009·7 cites·8 claims
- 2567US10115702B2Semiconductor chip for sensing temperature and semiconductor system including the sameYU KI HUN·Filed 2015·Granted Oct 30, 2018·3 cites·18 claims
- 2663US7548485B2Semiconductor memory device capable of synchronous/asynchronous operation and data input/output method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 16, 2009·5 cites·18 claims
- 2762US9436545B2Semiconducotr memory device including non-volatile memory cell arraySAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Sep 6, 2016·2 cites·20 claims
- 2862US7068058B2Semiconductor integrated circuit device with test element group circuitSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 27, 2006·7 cites·2 claims
- 2961US9147465B2Circuit for controlling sense amplifier source node in semiconductor memory device and controlling method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Sep 29, 2015·2 cites·19 claims
- 3058US7145743B2Apparatus and method for unlatching a head within a data storage deviceSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Dec 5, 2006·3 cites·25 claims
- 3158US5805012ASystems and methods for compensating a buffer for power supply fluctuationSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 8, 1998·15 cites·7 claims
- 3257US9455217B2Semiconductor package including multiple chips and separate groups of leadsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Sep 27, 2016·0 cites·20 claims
- 3349US6678193B2Apparatus and method for tracking between data and echo clockSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jan 13, 2004·4 cites·8 claims
- 3447US2014317471A1Semiconductor memory devices including separately disposed error-correcting code (ecc) circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 3546US2014219000A1Otp cell array including protected area, semiconductor memory device including the same, and method of programming the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 3644US2009045844A1Level shifter and semiconductor device having off-chip driverSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 3742US9412429B2Memory device with multiple voltage generatorsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 9, 2016·0 cites·20 claims
- 3841US6836441B2Apparatus of repairing memory cell and method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Dec 28, 2004·2 cites·4 claims
- 3941US6693831B2Apparatus of repairing memory cell and method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Feb 17, 2004·2 cites·9 claims
- 4039US7340560B2Methods and devices for accessing a memory using multiple separate address mapped temporary storage areasSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 4, 2008·0 cites·23 claims
- 4138US2014331006A1Semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 4237US7151710B2Semiconductor memory device with data input/output organization in multiples of nine bitsSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Dec 19, 2006·0 cites·21 claims
- 4337US6949960B2Semiconductor integrated circuit comprising functional modesSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 27, 2005·0 cites·14 claims
- 4436US6909661B2Semiconductor memory device with data input/output organization in multiples of nine bitsSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 21, 2005·1 cites·36 claims
- 4535US2007183234A1Semiconductor memory device having reduced voltage coupling between bit linesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 4634US2008072121A1Method and Apparatus For Repairing Defective Cell for Each Cell Section Word LineLEE SEUNG-MIN·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →