Inventor · disambiguated record
Chuljin Park
Also filed as: PARK CHULJIN
2 granted patents·9 pending applications·0 citations·filing 2021–2024
23Inventor score
Top patents by PatentIndex Score
11 records- 0166US2023407122A1Ink composition, layer using the same, and electrophoresis apparatus, and display device comprising the sameSAMSUNG DISPLAY CO LTD·Filed 2023·Application pending·0 cites
- 0264US2023407124A1Ink composition, layer, electrophoresis apparatus, and display device using the sameSAMSUNG DISPLAY CO LTD·Filed 2023·Application pending·0 cites
- 0361US12359084B2Ink composition, layer using same, and display deviceSAMSUNG SDI CO LTD·Filed 2022·Granted Jul 15, 2025·0 cites·17 claims
- 0461US2024166898A1Ink composition, layer and display device using sameSAMSUNG SDI CO LTD·Filed 2022·Application pending·0 cites
- 0557US2023122059A1Ink composition for electrophoresis apparatus, and display apparatus using the sameSAMSUNG SDI CO LTD·Filed 2021·Application pending·0 cites
- 0653US2024059919A1Ink composition, layer using the same, electrophoresis device and display device comprising the sameSAMSUNG DISPLAY CO LTD·Filed 2023·Application pending·0 cites
- 0753US2024093042A1Ink composition, layer using the same, electrophoresis device and display device comprising the sameSAMSUNG DISPLAY CO LTD·Filed 2023·Application pending·0 cites
- 0852US2025026948A1Ink composition, film using the same, and electrophoretic display deviceSAMSUNG DISPLAY CO LTD·Filed 2024·Application pending·0 cites
- 0951US11320732B2Method of measuring critical dimension of a three-dimensional structure and apparatus for measuring the sameSK HYNIX INC·Filed 2021·Granted May 3, 2022·0 cites·20 claims
- 1049US2024052190A1Ink composition, layer using same, and electrophoresis device and display device comprising sameSAMSUNG SDI CO LTD·Filed 2022·Application pending·0 cites
- 1146US2023227994A1Ink composition for electrophoresis device and display device using sameSAMSUNG SDI CO LTD·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →