Inventor · disambiguated record
Chunghyun Ryu
Also filed as: RYU CHUNGHYUN
9 granted patents·1 pending application·10 citations·filing 2020–2024
81Inventor score
Files withSAMSUNG ELECTRONICS CO LTD10
Top patents by PatentIndex Score
10 records- 0186US11856700B2Horizontally mounted capacitor module and electronic device including sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 26, 2023·3 cites·20 claims
- 0284US11869602B2Method and circuit for providing auxiliary power and storage device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jan 9, 2024·2 cites·20 claims
- 0382US11854648B2Method of resetting storage device, storage device performing the same and data center including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 26, 2023·1 cites·20 claims
- 0482US11295785B2Memory system storage device including path circuit in parallel with auxiliary power deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 5, 2022·2 cites·20 claims
- 0578US11488640B2Method of resetting storage device, storage device performing the same and data center including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Nov 1, 2022·1 cites·19 claims
- 0675US12277256B2Storage device and solid state drive device with structure for improving security performance and removing data, method of operating the same, and data center including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 15, 2025·1 cites·16 claims
- 0772US12334159B2Method and circuit for providing auxiliary power and storage device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jun 17, 2025·0 cites·12 claims
- 0865US11854645B2Memory system storage device with power loss protection circuitSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 0958US11281812B2Storage device and solid state drive device with structure for removing secure data, and data center including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 22, 2022·0 cites·20 claims
- 1055US2025341557A1Test device, test system and operating method of test deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →