Inventor · disambiguated record
Chang-Jen Shieh
Also filed as: SHIEH CHANG JEN
2 granted patents·70 citations·filing 2000–2003
65Inventor score
Technology areasH10P
Files withTAIWAN SEMICONDUCTOR MFG2
Top patents by PatentIndex Score
2 records- 0187US6350390B1Plasma etch method for forming patterned layer with enhanced critical dimension (CD) controlTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Feb 26, 2002·53 cites·16 claims
- 0272US6872667B1Method of fabricating semiconductor device with separate periphery and cell region etching stepsTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Mar 29, 2005·17 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →