Inventor · disambiguated record
Chin-Miin Shyu
Also filed as: SHYU CHIN-MIIN
7 granted patents·3 pending applications·214 citations·filing 1987–2011
87Inventor score
Top patents by PatentIndex Score
10 records- 0194US7145191B1P-channel field-effect transistor with reduced junction capacitanceNAT SEMICONDUCTOR CORP·Filed 2004·Granted Dec 5, 2006·57 cites·58 claims
- 0293US7879669B1Fabrication of field-effect transistor with reduced junction capacitance and threshold voltage of magnitude that decreases with increasing channel lengthNAT SEMICONDUCTOR CORP·Filed 2006·Granted Feb 1, 2011·17 cites·40 claims
- 0387US5602404ALow voltage triggering silicon controlled rectifier structures for ESD protectionNAT SEMICONDUCTOR CORP·Filed 1995·Granted Feb 11, 1997·91 cites·4 claims
- 0485US6797576B1Fabrication of p-channel field-effect transistor for reducing junction capacitanceNAT SEMICONDUCTOR CORP·Filed 2002·Granted Sep 28, 2004·35 cites·26 claims
- 0561US7964934B1Fuse target and method of forming the fuse target in a copper process flowNAT SEMICONDUCTOR CORP·Filed 2007·Granted Jun 21, 2011·2 cites·18 claims
- 0657US6586302B1Method of using trenching techniques to make a transistor with a floating gateNAT SEMICONDUCTOR CORP·Filed 2001·Granted Jul 1, 2003·8 cites·8 claims
- 0753US2012181614A1Structure and Fabrication of Field-effect Transistor for Alleviating Short-channel Effects and/or Reducing Junction CapacitanceTENG CHIH SIEH·Filed 2011·Application pending·0 cites
- 0851US2012273880A1Structure and Fabrication of Field-effect Transistor for Alleviating Short-channel Effects and/or Reducing Junction CapacitanceTENG CHIH SIEH·Filed 2010·Application pending·0 cites
- 0951US2012181620A1Structure and Fabrication of Field-effect Transistor for Alleviating Short-channel Effects and/or Reducing Junction CapacitanceBULUCEA CONSTANTIN·Filed 2010·Application pending·0 cites
- 1030US4839704AApplication of deep-junction non-self-aligned transistors for suppressing hot carriersNAT SEMICONDUCTOR CORP·Filed 1987·Granted Jun 13, 1989·4 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →