Inventor · disambiguated record
Christof Stey
Also filed as: STEY CHRISTOF
2 granted patents·56 citations·filing 2001–2019
56Inventor score
Files withLEICA MICROSYSTEMS2
Top patents by PatentIndex Score
2 records- 0187US6600560B2Optical measurement arrangement having an ellipsometerLEICA MICROSYSTEMS·Filed 2001·Granted Jul 29, 2003·56 cites·13 claims
- 0247US12298490B2Method for automatically determining the position in a sample arrangement and corresponding microscopeLEICA MICROSYSTEMS·Filed 2019·Granted May 13, 2025·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →