Inventor · disambiguated record
Chanmin Su
Also filed as: SU CHANMIN · SU CHANMIN QUANMIN
56 granted patents·11 pending applications·573 citations·filing 2001–2025
98Inventor score
Top patents by PatentIndex Score
67 records- 0197US9588136B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Mar 7, 2017·8 cites·15 claims
- 0296US8739309B2Method and apparatus of operating a scanning probe microscopeHU YAN·Filed 2009·Granted May 27, 2014·19 cites·27 claims
- 0396US8650660B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleSHI JIAN·Filed 2011·Granted Feb 11, 2014·34 cites·8 claims
- 0495US9322842B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2014·Granted Apr 26, 2016·10 cites·19 claims
- 0595US7770231B2Fast-scanning SPM and method of operating sameVEECO INSTR INC·Filed 2007·Granted Aug 3, 2010·81 cites·26 claims
- 0695US7155964B2Method and apparatus for measuring electrical properties in torsional resonance modeVEECO INSTR INC·Filed 2005·Granted Jan 2, 2007·20 cites·36 claims
- 0794US7748260B2Thermal mechanical drive actuator, thermal probe and method of thermally driving a probeVEECO INSTR INC·Filed 2006·Granted Jul 6, 2010·18 cites·30 claims
- 0894US6945099B1Torsional resonance mode probe-based instrument and methodVEECO INSTR INC·Filed 2002·Granted Sep 20, 2005·66 cites·65 claims
- 0993US7617719B2Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imagingDOW CHEMICAL CO·Filed 2006·Granted Nov 17, 2009·27 cites·29 claims
- 1093US7055378B2System for wide frequency dynamic nanomechanical analysisVEECO INSTR INC·Filed 2003·Granted Jun 6, 2006·70 cites·27 claims
- 1192US9291640B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleBRUKER NANO INC·Filed 2014·Granted Mar 22, 2016·9 cites·10 claims
- 1291US9910064B2Force measurement with real-time baseline determinationBRUKER NANO INC·Filed 2017·Granted Mar 6, 2018·3 cites·11 claims
- 1391US9719916B2PeakForce photothermal-based detection of IR nanoabsorptionBRUKER NANO INC·Filed 2016·Granted Aug 1, 2017·3 cites·19 claims
- 1491US9213047B2Method and apparatus of electrical property measurement using an AFM operating in peak force tapping modeBRUKER NANO INC·Filed 2013·Granted Dec 15, 2015·7 cites·17 claims
- 1591US8646109B2Method and apparatus of operating a scanning probe microscopeHU YAN·Filed 2010·Granted Feb 4, 2014·27 cites·21 claims
- 1690US8881311B2Method and apparatus of physical property measurement using a probe-based nano-localized light sourceBRUKER NANO INC·Filed 2014·Granted Nov 4, 2014·10 cites·20 claims
- 1789US10197595B2Dual-probe scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Feb 5, 2019·5 cites·6 claims
- 1889US8322220B2Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detectionPRATER CRAIG·Filed 2008·Granted Dec 4, 2012·12 cites·34 claims
- 1988US7757544B2Method and apparatus for measuring electrical properties in torsional resonance modeVEECO INSTR INC·Filed 2007·Granted Jul 20, 2010·10 cites·17 claims
- 2087US7584653B2System for wide frequency dynamic nanomechanical analysisVEECO INSTR INC·Filed 2006·Granted Sep 8, 2009·14 cites·32 claims
- 2187US7555940B2Cantilever free-decay measurement system with coherent averagingVEECO INSTR INC·Filed 2006·Granted Jul 7, 2009·11 cites·22 claims
- 2286US10845382B2Infrared characterization of a sample using oscillating modeBRUKER NANO INC·Filed 2017·Granted Nov 24, 2020·3 cites·16 claims
- 2386US10502761B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2017·Granted Dec 10, 2019·1 cites·7 claims
- 2486US10197596B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2017·Granted Feb 5, 2019·1 cites·12 claims
- 2586US9575090B2Force measurement with real-time baseline determinationBRUKER NANO INC·Filed 2014·Granted Feb 21, 2017·5 cites·9 claims
- 2686US8997259B2Method and apparatus of tuning a scanning probe microscopeBRUKER NANO INC·Filed 2012·Granted Mar 31, 2015·5 cites·20 claims
- 2785US10520426B2Peakforce photothermal-based detection of IR nanoabsorptionBRUKER NANO INC·Filed 2017·Granted Dec 31, 2019·1 cites·12 claims
- 2885US8756710B2Miniaturized cantilever probe for scanning probe microscopy and fabrication thereofWANG WEIJIE·Filed 2012·Granted Jun 17, 2014·5 cites·18 claims
- 2984US8904560B2Closed loop controller and method for fast scanning probe microscopySHI JIAN·Filed 2007·Granted Dec 2, 2014·10 cites·42 claims
- 3083US9810713B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Nov 7, 2017·1 cites·16 claims
- 3183US7107825B2Method and apparatus for the actuation of the cantilever of a probe-based instrumentGEORGIA TECH RES INST·Filed 2003·Granted Sep 19, 2006·31 cites·41 claims
- 3281US9869694B2Method and apparatus of electrical property measurement using an AFM operating in peak force tapping modeBRUKER NANO INC·Filed 2015·Granted Jan 16, 2018·1 cites·16 claims
- 3379US11002757B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2019·Granted May 11, 2021·0 cites·14 claims
- 3479US9995765B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleBRUKER NANO INC·Filed 2016·Granted Jun 12, 2018·1 cites·9 claims
- 3577US10175263B2Sample vessel retention structure for scanning probe microscopeBRUKER NANO INC·Filed 2016·Granted Jan 8, 2019·1 cites·23 claims
- 3677US7574903B2Method and apparatus of driving torsional resonance mode of a probe-based instrumentVEECO INSTR INC·Filed 2007·Granted Aug 18, 2009·5 cites·14 claims
- 3776US9523707B2Closed loop controller and method for fast scanning probe microscopyBRUKER NANO INC·Filed 2016·Granted Dec 20, 2016·1 cites·17 claims
- 3876US9448252B2Chemical nano-identification of a sample using normalized near-field spectroscopyBRUKER NANO INC·Filed 2014·Granted Sep 20, 2016·2 cites·21 claims
- 3976US9244096B2Closed loop controller and method for fast scanning probe microscopyBRUKER NANO INC·Filed 2014·Granted Jan 26, 2016·2 cites·18 claims
- 4074US9291639B2Dual-probe scanning probe microscopeBRUKER NANO INC·Filed 2014·Granted Mar 22, 2016·2 cites·13 claims
- 4172US7658097B2Method and apparatus of high speed property mappingVEECO INSTR INC·Filed 2006·Granted Feb 9, 2010·7 cites·36 claims
- 4271US9739799B2Method and apparatus to compensate for deflection artifacts in an atomic force microscopeBRUKER NANO INC·Filed 2014·Granted Aug 22, 2017·2 cites·17 claims
- 4370US11555827B2Torsion wing probe assemblyBRUKER NANO INC·Filed 2021·Granted Jan 17, 2023·0 cites·10 claims
- 4468US10663483B2Method and apparatus of using peak force tapping mode to measure physical properties of a sampleBRUKER NANO INC·Filed 2018·Granted May 26, 2020·0 cites·3 claims
- 4568US9274139B2Method and apparatus of operating a scanning probe microscopeBRUKER NANO INC·Filed 2014·Granted Mar 1, 2016·2 cites·20 claims
- 4668US8161805B2Method and apparatus for obtaining quantitative measurements using a probe based instrumentSU CHANMIN·Filed 2009·Granted Apr 24, 2012·4 cites·14 claims
- 4767US7596990B2Method and apparatus for obtaining quantitative measurements using a probe based instrumentVEECO INSTR INC·Filed 2005·Granted Oct 6, 2009·3 cites·35 claims
- 4866US11119118B2Torsion wing probe assemblyBRUKER NANO INC·Filed 2020·Granted Sep 14, 2021·0 cites·18 claims
- 4966US9933453B2Chemical nano-identification of a sample using normalized near-field spectroscopyBRUKER NANO INC·Filed 2017·Granted Apr 3, 2018·0 cites·11 claims
- 5066US9709597B2Miniaturized cantilever probe for scanning probe microscopy and fabrication thereofBRUKER NANO INC·Filed 2014·Granted Jul 18, 2017·1 cites·16 claims
Showing the top 50 of 67 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →