Inventor · disambiguated record
Chang-Fa Sun
Also filed as: SUN CHANG-FA
12 granted patents·3 pending applications·133 citations·filing 2006–2011
89Inventor score
Top patents by PatentIndex Score
15 records- 0196US7848833B2Flexible fixing system for product testingSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Dec 7, 2010·74 cites·19 claims
- 0293US8210510B2Clamping device for portable electronic deviceLI LEI·Filed 2010·Granted Jul 3, 2012·26 cites·11 claims
- 0378US7663359B2Testing mechanism for casingsSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Feb 16, 2010·11 cites·15 claims
- 0468US7757566B2Testing system for flip-type electronic deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Jul 20, 2010·5 cites·14 claims
- 0565US7779550B2Micrometer-based measuring system and method of using sameSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Aug 24, 2010·5 cites·19 claims
- 0663US7428783B2Testing system for flatness and parallelismSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Granted Sep 30, 2008·5 cites·13 claims
- 0761US7984561B2Device for determining dimension of a workpieceSHENZHEN FUTAIHONG PREC IND CO·Filed 2009·Granted Jul 26, 2011·4 cites·10 claims
- 0854US7950130B2Method for making an inspection fixture, and mold assembly used in the methodSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Granted May 31, 2011·1 cites·11 claims
- 0952US7743676B2Key testing apparatusSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Jun 29, 2010·2 cites·20 claims
- 1052US2007255673A1Method for judging standardization order of workpiecesSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Application pending·0 cites
- 1150US2008203637A1Clamping device for portable electronic deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Application pending·0 cites
- 1249US7798022B2Testing devices for multihole workpieceSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Sep 21, 2010·0 cites·16 claims
- 1346US8250740B2Method for making an inspection fixture, and mold assembly used in the methodCHEN PING·Filed 2011·Granted Aug 28, 2012·0 cites·3 claims
- 1442US7966891B2Fatigue test apparatus for thin element of electronic deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2009·Granted Jun 28, 2011·0 cites·20 claims
- 1539US2009292498A1Resistance testing deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →