Inventor · disambiguated record
Chung-Ren Sun
Also filed as: SUN CHUNG-REN
12 granted patents·6 pending applications·39 citations·filing 2010–2025
88Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD10TAIWAN SEMICONDUCTOR MFG4SUN CHUNG-REN2JANGJIAN SHIU-KO1LIAO MIAO-CHENG1
Top patents by PatentIndex Score
18 records- 0197US9257476B2Grids in backside illumination image sensor chips and methods for forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Feb 9, 2016·11 cites·20 claims
- 0296US9478581B2Grids in backside illumination image sensor chips and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Oct 25, 2016·9 cites·20 claims
- 0388US9041140B2Grids in backside illumination image sensor chips and methods for forming the sameJANGJIAN SHIU-KO·Filed 2012·Granted May 26, 2015·4 cites·19 claims
- 0481US9722076B2Method for manufacturing semiconductor device with contamination improvementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Aug 1, 2017·3 cites·18 claims
- 0580US9570557B2Tilt implantation for STI formation in FinFET structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Feb 14, 2017·3 cites·20 claims
- 0678US9263275B2Interface for metal gate integrationTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Feb 16, 2016·6 cites·20 claims
- 0778US2025349609A1Etch stop layersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0872US9105578B2Interface for metal gate integrationTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Aug 11, 2015·3 cites·20 claims
- 0971US2025105055A1Etch stop layersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1060US11004973B2Semiconductor device with contamination improvementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 11, 2021·0 cites·20 claims
- 1158US2025226322A1Interconnect layer with different dielectric regionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1255US10312366B2Semiconductor device with contamination improvementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jun 4, 2019·0 cites·20 claims
- 1350US11329160B2FinFET gate structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted May 10, 2022·0 cites·20 claims
- 1449US9589804B2Method of forming finFET gate oxideTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Mar 7, 2017·0 cites·20 claims
- 1543US2010252930A1Method for Improving Performance of Etch Stop LayerTAIWAN SEMICONDUCTOR MFG·Filed 2010·Application pending·0 cites
- 1641US2012256324A1Method for Improving Performance of Etch Stop LayerLIAO MIAO-CHENG·Filed 2012·Application pending·0 cites
- 1733US9112090B2UV radiation recovery of image sensorSUN CHUNG-REN·Filed 2012·Granted Aug 18, 2015·0 cites·19 claims
- 1831US2014007905A1Wafer cleaning system and method using electrolytic gas for back-end purgeSUN CHUNG-REN·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →