Inventor · disambiguated record
Chuen-Lin Tien
Also filed as: TIEN CHUEN-LIN
2 granted patents·1 pending application·20 citations·filing 2000–2022
55Inventor score
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3 records- 0170US6466308B1Method for measuring a thermal expansion coefficient of a thin film by using phase shifting interferometryPREC INSTR DEV CT NAT SCIENCE·Filed 2000·Granted Oct 15, 2002·19 cites·15 claims
- 0253US10697841B2System for measuring residual stress in optical thin films in both transmission and reflectionTIEN CHUEN LIN·Filed 2018·Granted Jun 30, 2020·1 cites·16 claims
- 0346US2022390294A1Method and system for measuring interfacial stress and residual stress in multilayer thin films coated on a substrateUNIV FENG CHIA·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →