Inventor · disambiguated record
Charles F. Toewe
Also filed as: TOEWE CHARLES F
3 granted patents·439 citations·filing 1993–1995
80Inventor score
Files withMOTOROLA INC3
Top patents by PatentIndex Score
3 records- 0195US5399505AMethod and apparatus for performing wafer level testing of integrated circuit diceMOTOROLA INC·Filed 1993·Granted Mar 21, 1995·189 cites·33 claims
- 0292US5504369AApparatus for performing wafer level testing of integrated circuit diceMOTOROLA INC·Filed 1994·Granted Apr 2, 1996·129 cites·46 claims
- 0388US5654588AApparatus for performing wafer-level testing of integrated circuits where the wafer uses a segmented conductive top-layer bus structureMOTOROLA INC·Filed 1995·Granted Aug 5, 1997·121 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →