Inventor · disambiguated record
Cheng-Tao Tsai
Also filed as: TSAI CHENG-TAO
14 granted patents·10 pending applications·365 citations·filing 1995–2024
92Inventor score
Files withJAEYOU CO LTD6CHENG MEI INSTRUMENT TECH CO LTD5CHENG MEI INSTR TECHNOLOGY CO LTD4TSAI CHENG-TAO3APEX MFG CO LTD1
Top patents by PatentIndex Score
24 records- 0189US6799445B1Dual-use lock whose unlocking numeral combination can be traced after having been forgottenJAEYOU CO LTD·Filed 2003·Granted Oct 5, 2004·56 cites·2 claims
- 0289US6508089B1Lock used for the cabinets in public placesJAEYOU CO LTD·Filed 2002·Granted Jan 21, 2003·64 cites·4 claims
- 0387US6799446B1Combination lock changeable in combinationJAEYOU CO LTD·Filed 2003·Granted Oct 5, 2004·47 cites·8 claims
- 0478US5899099ACombination lockFiled 1998·Granted May 4, 1999·57 cites·2 claims
- 0577US6711922B1Mechanism of a combination lock for beginning and ending combination-changing operationJAEYOU CO LTD·Filed 2003·Granted Mar 30, 2004·32 cites·2 claims
- 0676US6981627B2Electric stapler having an apparatus to bend staple legs and the apparatusAPEX MFG CO LTD·Filed 2004·Granted Jan 3, 2006·31 cites·14 claims
- 0775US5636539AMain body structure of combination lockFiled 1995·Granted Jun 10, 1997·54 cites·1 claims
- 0871US6439006B1Combination lockJAEYOU CO LTD·Filed 2000·Granted Aug 27, 2002·18 cites·4 claims
- 0965US7878336B2System and method for inspection of chips on trayCHENG MEI INSTR TECHNOLOGY CO LTD·Filed 2009·Granted Feb 1, 2011·5 cites·14 claims
- 1054US2025216343A1Method and device of inspecting surface of interconnect structureCHENG MEI INSTRUMENT TECH CO LTD·Filed 2024·Application pending·0 cites
- 1154US2025244252A1Inspection device and inspection methodCHENG MEI INSTRUMENT TECH CO LTD·Filed 2024·Application pending·0 cites
- 1253US7287882B2Shining lock structureJAEYOU CO LTD·Filed 2005·Granted Oct 30, 2007·1 cites·3 claims
- 1349US12435547B2Lock with adjustable cableJAE YOU CO LTD·Filed 2023·Granted Oct 7, 2025·0 cites·4 claims
- 1448US8311666B2System and method for separating defective dies from waferCHEN TE CHUN·Filed 2009·Granted Nov 13, 2012·0 cites·12 claims
- 1546US8275188B2System and method for inspecting chips in a trayTSAI CHENG TAO·Filed 2008·Granted Sep 25, 2012·0 cites·26 claims
- 1638US8226346B2System and method for inspecting chips in a tray and tray handling apparatus thereofTSAI CHENG TAO·Filed 2009·Granted Jul 24, 2012·0 cites·15 claims
- 1736US2021313207A1Wafer image capturing apparatus and method of wafer image capturingCHENG MEI INSTRUMENT TECH CO LTD·Filed 2021·Application pending·0 cites
- 1832US2007234765A1Combination lock structureTSAI CHENG-TAO·Filed 2006·Application pending·0 cites
- 1932US2002139153A1Lock with a support helping to extend locking rangeFiled 2001·Application pending·0 cites
- 2031US2016047755A1Optical measuring apparatus and method for measuring patterned sapphire substrateCHENG MEI INSTR TECHNOLOGY CO LTD·Filed 2015·Application pending·0 cites
- 2131US2016047756A1Method for measuring patterned sapphire substrateCHENG MEI INSTR TECHNOLOGY CO LTD·Filed 2015·Application pending·0 cites
- 2231US2016047754A1Light deflection detection module and measurement and calibration method using the sameCHENG MEI INSTR TECHNOLOGY CO LTD·Filed 2015·Application pending·0 cites
- 2329US2021287397A1Image calibration method for imaging systemCHENG MEI INSTRUMENT TECH CO LTD·Filed 2020·Application pending·0 cites
- 2426US2020105020A1Method of spectral analyzing with a color cameraCHENG MEI INSTRUMENT TECH CO LTD·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →