Inventor · disambiguated record
Changyong Um
Also filed as: UM CHANGYONG
3 granted patents·12 pending applications·18 citations·filing 2009–2024
67Inventor score
Top patents by PatentIndex Score
15 records- 0191US9515120B2Image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Dec 6, 2016·8 cites·20 claims
- 0290US9679935B2Image sensorsSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 13, 2017·5 cites·16 claims
- 0360US8644061B2Variable resistance memory device performing program and verification operationHWANG YOUNGNAM·Filed 2009·Granted Feb 4, 2014·5 cites·19 claims
- 0460US2025142233A1Stacked image sensor and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0558US2025160010A1Image sensor pixel and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0658US2025221063A1Image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0756US2024170520A1Image sensor and manufacturing method thereofSAMSUNG ELECTRONICSCO LTD·Filed 2023·Application pending·0 cites
- 0856US2024170530A1Integrated circuit device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0956US2024194717A1Image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1053US2023197756A1Image sensor including stacked chipsSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1152US2023207595A1Image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1252US2024379722A1Semiconductor device and image sensor including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1352US2023395567A1Semiconductor package and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1450US2023197755A1Image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1549US2023163151A1Image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →