Inventor · disambiguated record
Chungwei Wang
Also filed as: WANG CHUNGWEI
2 granted patents·5 citations·filing 2017–2019
52Inventor score
Technology areasH10P
Files withTAIWAN SEMICONDUCTOR MFG CO LTD2
Top patents by PatentIndex Score
2 records- 0182US11071513B2Test key design to enable X-ray scatterometry measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 27, 2021·3 cites·20 claims
- 0275US10499876B2Test key design to enable X-ray scatterometry measurementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 10, 2019·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →