Inventor · disambiguated record

Chengzhang Wang

Also filed as: WANG CHENGZHANG

1 granted patent·2 citations·filing 2022–2022

17Inventor score

Technology areasG01N

Files withTHE 59TH INST OF CHINA ORDNANCE INDUSTRY1

Top patents by PatentIndex Score

1 record

0183US12099025B2Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detectionTHE 59TH INST OF CHINA ORDNANCE INDUSTRY·Filed 2022·Granted Sep 24, 2024·2 cites·10 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →