Inventor · disambiguated record
Changtao Wang
Also filed as: WANG CHANGTAO
6 granted patents·3 pending applications·2 citations·filing 2014–2022
66Inventor score
Files withINST OPTICS & ELECTRONICS CAS8THE INST OF OPTICS AND ELECTRONICS CHINESE ACADEMY OF SCIENCES1
Top patents by PatentIndex Score
9 records- 0165US9958784B2Super-resolution imaging photolithographyTHE INST OF OPTICS AND ELECTRONICS CHINESE ACADEMY OF SCIENCES·Filed 2014·Granted May 1, 2018·2 cites·22 claims
- 0259US12174322B2F-P sensor probe, absolute distance measurement device, and absolute distance measurement methodINST OPTICS & ELECTRONICS CAS·Filed 2022·Granted Dec 24, 2024·0 cites·19 claims
- 0358US12100188B2Template mark detection method and template position correction method based on single cameraINST OPTICS & ELECTRONICS CAS·Filed 2022·Granted Sep 24, 2024·0 cites·10 claims
- 0457US2024280901A1Photoresist composition and use thereofINST OPTICS & ELECTRONICS CAS·Filed 2022·Application pending·0 cites
- 0556US12078937B1Near-field lithography immersion system, immersion unit and interface module thereofINST OPTICS & ELECTRONICS CAS·Filed 2022·Granted Sep 3, 2024·0 cites·10 claims
- 0650US12085846B2Method for inverse optical proximity correction of super-resolution lithography based on level set algorithmINST OPTICS & ELECTRONICS CAS·Filed 2021·Granted Sep 10, 2024·0 cites·12 claims
- 0740US11693320B2Secondary imaging optical lithography method and apparatusINST OPTICS & ELECTRONICS CAS·Filed 2018·Granted Jul 4, 2023·0 cites·20 claims
- 0839US2021200079A1Negative refraction imaging lithographic method and equipmentINST OPTICS & ELECTRONICS CAS·Filed 2018·Application pending·0 cites
- 0938US2019137793A1Broadband electromagnetic wave phase modulating method and meta surface sub-wavelength structureINST OPTICS & ELECTRONICS CAS·Filed 2016·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Changtao Wang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →