Inventor · disambiguated record
Changting Wang
Also filed as: WANG CHANGTING
21 granted patents·7 pending applications·431 citations·filing 2003–2014
95Inventor score
Files withGEN ELECTRIC19WANG CHANGTING3KORUKONDA SANGHAMITHRA2HUAWEI TECH CO LTD1MAY ANDRZEJ MICHAL1
Top patents by PatentIndex Score
28 records- 0196US7015690B2Omnidirectional eddy current probe and inspection systemGEN ELECTRIC·Filed 2004·Granted Mar 21, 2006·127 cites·19 claims
- 0295US6892115B2Method and apparatus for optimized centralized critical control architecture for switchgear and power equipmentGEN ELECTRIC·Filed 2003·Granted May 10, 2005·93 cites·37 claims
- 0393US6999291B2Method and apparatus for node electronics unit architectureGEN ELECTRIC·Filed 2003·Granted Feb 14, 2006·82 cites·41 claims
- 0492US7402999B2Pulsed eddy current pipeline inspection system and methodGEN ELECTRIC·Filed 2005·Granted Jul 22, 2008·20 cites·22 claims
- 0587US7206706B2Inspection method and system using multifrequency phase analysisGEN ELECTRIC·Filed 2005·Granted Apr 17, 2007·18 cites·21 claims
- 0683US8436608B2Eddy current inspection system and methodSUN HAIYAN·Filed 2009·Granted May 7, 2013·12 cites·18 claims
- 0783US7518359B2Inspection of non-planar parts using multifrequency eddy current with phase analysisGEN ELECTRIC·Filed 2006·Granted Apr 14, 2009·8 cites·12 claims
- 0882US8179132B2Method and system for integrating eddy current inspection with a coordinate measuring deviceWU YANYAN·Filed 2009·Granted May 15, 2012·9 cites·20 claims
- 0981US7948233B2Omnidirectional eddy current array probes and methods of useGEN ELECTRIC·Filed 2008·Granted May 24, 2011·7 cites·19 claims
- 1079US8884614B2Eddy current array probeWANG CHANGTING·Filed 2011·Granted Nov 11, 2014·5 cites·6 claims
- 1176US7952348B2Flexible eddy current array probe and methods of assembling the sameGEN ELECTRIC·Filed 2007·Granted May 31, 2011·8 cites·14 claims
- 1275US8378668B2Method for non-destructive testing of composite systemsGEN ELECTRIC·Filed 2008·Granted Feb 19, 2013·3 cites·17 claims
- 1375US8269489B2System and method for eddy current inspection of parts with complex geometriesWANG CHANGTING·Filed 2008·Granted Sep 18, 2012·6 cites·12 claims
- 1474US9759686B2Magnetic inspection systems for inspection of target objectsGEN ELECTRIC·Filed 2014·Granted Sep 12, 2017·2 cites·18 claims
- 1570US7005851B2Methods and apparatus for inspection utilizing pulsed eddy currentGEN ELECTRIC·Filed 2003·Granted Feb 28, 2006·8 cites·31 claims
- 1669US7154265B2Eddy current probe and inspection methodGEN ELECTRIC·Filed 2004·Granted Dec 26, 2006·10 cites·12 claims
- 1765US8710834B2Drive coil, measurement probe comprising the drive coil and methods utilizing the measurement probeMAY ANDRZEJ MICHAL·Filed 2010·Granted Apr 29, 2014·1 cites·8 claims
- 1865US7888932B2Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the sameGEN ELECTRIC·Filed 2007·Granted Feb 15, 2011·3 cites·11 claims
- 1965US7817845B2Multi-frequency image processing for inspecting parts having complex geometric shapesGEN ELECTRIC·Filed 2006·Granted Oct 19, 2010·7 cites·17 claims
- 2060US7994780B2System and method for inspection of parts with an eddy current probeGEN ELECTRIC·Filed 2007·Granted Aug 9, 2011·2 cites·20 claims
- 2152US2007222439A1Eddy current array probes with enhanced drive fieldsGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 2250US2006132123A1Eddy current array probes with enhanced drive fieldsGEN ELECTRIC·Filed 2004·Application pending·0 cites
- 2346US2008278151A1System and methods for inspecting internal cracksGEN ELECTRIC·Filed 2007·Application pending·0 cites
- 2446US2011004452A1Method for compensation of responses from eddy current probesKORUKONDA SANGHAMITHRA·Filed 2007·Application pending·0 cites
- 2546US2010312494A1Process and apparatus for testing a component using an omni-directional eddy current probeKORUKONDA SANGHAMITHRA·Filed 2007·Application pending·0 cites
- 2645US10324896B2Method and apparatus for acquiring resourceHUAWEI TECH CO LTD·Filed 2014·Granted Jun 18, 2019·0 cites·23 claims
- 2741US2011215799A1Magnetic inspection systems for inspection of target objectsGEN ELECTRIC·Filed 2011·Application pending·0 cites
- 2835US2012043962A1Method and apparatus for eddy current inspection of case-hardended metal componentsWANG CHANGTING·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →